John J. Bockman

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
High efficiency beam distribution with independent wavefront correc...
- Patent number 7,280,275
- Issue date Oct 9, 2007
- Agilent Technologies, Inc.
- W. Clay Schluchter
- G02 - OPTICS
Information Patent Grant
Differential interferometers creating desired beam patterns
- Patent number 7,212,290
- Issue date May 1, 2007
- Agilent Technologies, Inc.
- Kevin R. Fine
- G01 - MEASURING TESTING
Information Patent Grant
Differential interferometer with improved cyclic nonlinearity
- Patent number 7,196,797
- Issue date Mar 27, 2007
- Agilent Technologies, Inc.
- John J. Bockman
- G01 - MEASURING TESTING
Information Patent Grant
Systems using polarization-manipulating retroreflectors
- Patent number 7,193,721
- Issue date Mar 20, 2007
- Agilent Technologies, Inc.
- Miao Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Phase-compensated cube corner in laser interferometry
- Patent number 7,165,850
- Issue date Jan 23, 2007
- Agilent Technologies, Inc.
- Lawrence Hakchu Lee
- G01 - MEASURING TESTING
Information Patent Grant
Phase-compensated cube corner in laser interferometry
- Patent number 7,121,671
- Issue date Oct 17, 2006
- Agilent Technologies, Inc.
- Lawrence Hakchu Lee
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer using beam re-tracing to eliminate beam walk-off
- Patent number 6,897,962
- Issue date May 24, 2005
- Agilent Technologies, Inc.
- Eric S. Johnstone
- G01 - MEASURING TESTING
Information Patent Grant
Compact beam re-tracing optics to eliminate beam walk-off in an int...
- Patent number 6,806,960
- Issue date Oct 19, 2004
- Agilent Technologies, Inc.
- Kerry D. Bagwell
- G01 - MEASURING TESTING
Information Patent Grant
Cube-corner reflector permitting tight beam spacing and minimal wav...
- Patent number 6,736,518
- Issue date May 18, 2004
- Agilent Technologies, Inc.
- R. Todd Belt
- G01 - MEASURING TESTING
Information Patent Grant
Multi-axis interferometer with integrated optical structure and met...
- Patent number 6,542,247
- Issue date Apr 1, 2003
- Agilent Technologies, Inc.
- John J. Bockman
- G01 - MEASURING TESTING
Information Patent Grant
Method and interferometric apparatus for measuring changes in displ...
- Patent number 5,677,768
- Issue date Oct 14, 1997
- Hewlett-Packard Company
- John J. Bockman
- G01 - MEASURING TESTING
Information Patent Grant
Linear-and-angular measuring plane mirror interferometer
- Patent number 5,064,289
- Issue date Nov 12, 1991
- Hewlett-Packard Company
- John J. Bockman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical interferometer
- Publication number 20070109552
- Publication date May 17, 2007
- Greg C. Felix
- G01 - MEASURING TESTING
Information Patent Application
High efficiency beam distribution with independent wavefront correc...
- Publication number 20070024976
- Publication date Feb 1, 2007
- W. Clay Schluchter
- G02 - OPTICS
Information Patent Application
PHASE-COMPENSATED CUBE CORNER IN LASER INTERFEROMETRY
- Publication number 20060262402
- Publication date Nov 23, 2006
- Lawrence Hakchu Lee
- G02 - OPTICS
Information Patent Application
Differential interferometers creating desired beam patterns
- Publication number 20060039005
- Publication date Feb 23, 2006
- Kevin R. Fine
- G01 - MEASURING TESTING
Information Patent Application
Differential interferometer with improved cyclic nonlinearity
- Publication number 20050264822
- Publication date Dec 1, 2005
- John J. Bockman
- G02 - OPTICS
Information Patent Application
Systems using polarization-manipulating retroreflectors
- Publication number 20050264823
- Publication date Dec 1, 2005
- Miao Zhu
- G01 - MEASURING TESTING
Information Patent Application
Phase-compensated cube corner in laser interferometry
- Publication number 20050128589
- Publication date Jun 16, 2005
- Lawrence Hakchu Lee
- G02 - OPTICS
Information Patent Application
Interferometer using beam re-tracing to eliminate beam walk-off
- Publication number 20030197869
- Publication date Oct 23, 2003
- Eric S. Johnstone
- G01 - MEASURING TESTING
Information Patent Application
Compact beam re-tracing optics to eliminate beam walk-off in an int...
- Publication number 20030197870
- Publication date Oct 23, 2003
- Kerry D. Bagwell
- G01 - MEASURING TESTING
Information Patent Application
Multi-axis interferometer with integrated optical structure and met...
- Publication number 20020191191
- Publication date Dec 19, 2002
- John J. Bockman
- G01 - MEASURING TESTING

John J. Bockman

Person

Patents Grantslast 30 patents

High efficiency beam distribution with independent wavefront correc...

Differential interferometers creating desired beam patterns

Differential interferometer with improved cyclic nonlinearity

Systems using polarization-manipulating retroreflectors

Phase-compensated cube corner in laser interferometry

Phase-compensated cube corner in laser interferometry

Interferometer using beam re-tracing to eliminate beam walk-off

Compact beam re-tracing optics to eliminate beam walk-off in an int...

Cube-corner reflector permitting tight beam spacing and minimal wav...

Multi-axis interferometer with integrated optical structure and met...

Method and interferometric apparatus for measuring changes in displ...

Linear-and-angular measuring plane mirror interferometer

Patents Applicationslast 30 patents

Optical interferometer

High efficiency beam distribution with independent wavefront correc...

PHASE-COMPENSATED CUBE CORNER IN LASER INTERFEROMETRY

Differential interferometers creating desired beam patterns

Differential interferometer with improved cyclic nonlinearity

Systems using polarization-manipulating retroreflectors

Phase-compensated cube corner in laser interferometry

Interferometer using beam re-tracing to eliminate beam walk-off

Compact beam re-tracing optics to eliminate beam walk-off in an int...

Multi-axis interferometer with integrated optical structure and met...