John J. Boyle

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Natick, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Hemispherical star camera
- Patent number 10,901,190
- Issue date Jan 26, 2021
- The Charles Stark Draper Laboratory, Inc.
- Erik L. Waldron
- G01 - MEASURING TESTING
Information Patent Grant
Electron-bombarded active pixel sensor star camera
- Patent number 9,733,087
- Issue date Aug 15, 2017
- The Charles Stark Draper Laboratory, Inc.
- Juha-Pekka J. Laine
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
High performance scanning miniature star camera system
- Patent number 9,648,252
- Issue date May 9, 2017
- The Charles Stark Draper Laboratory, Inc.
- Juha-Pekka J. Laine
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electron bombarded active pixel sensor
- Patent number 6,285,018
- Issue date Sep 4, 2001
- Intevac, Inc.
- Verle W. Aebi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for attaching a die to a carrier utilizing an electrically n...
- Patent number 6,204,090
- Issue date Mar 20, 2001
- The Charles Stark Draper Laboratory, Inc.
- John J. Boyle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Intergrated circuit die assembly
- Patent number 6,020,646
- Issue date Feb 1, 2000
- The Charles Stark Draper Laboratory, Inc.
- John J. Boyle
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Hemispherical Star Camera
- Publication number 20160381267
- Publication date Dec 29, 2016
- The Charles Stark Draper Laboratory, Inc.
- Erik L. Waldron
- G02 - OPTICS
Information Patent Application
HIGH PERFORMANCE SCANNING MINIATURE STAR CAMERA SYSTEM
- Publication number 20140267755
- Publication date Sep 18, 2014
- The Charles Stark Draper Laboratory, Inc.
- Juha-Pekka J. Laine
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON-BOMBARDED ACTIVE PIXEL SENSOR STAR CAMERA
- Publication number 20140267641
- Publication date Sep 18, 2014
- The Charles Stark Draper Laboratory, Inc.
- Juha-Pekka J. Laine
- G01 - MEASURING TESTING