John J. Pickerd

Person

Hillsboro, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Cyclic loop image representation for waveform data
- Patent number 12,092,692
- Issue date Sep 17, 2024
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Swept parameter oscilloscope
- Patent number 12,085,590
- Issue date Sep 10, 2024
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Combined TDECQ measurement and transmitter tuning using machine lea...
- Patent number 11,940,889
- Issue date Mar 26, 2024
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical transmitter tuning using machine learning and reference par...
- Patent number 11,923,895
- Issue date Mar 5, 2024
- Tektronix, Inc.
- John J. Pickerd
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical transceiver tuning using machine learning
- Patent number 11,923,896
- Issue date Mar 5, 2024
- Tektronix, Inc.
- Evan Douglas Smith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine learning for taps to accelerate TDECQ and other measurements
- Patent number 11,907,090
- Issue date Feb 20, 2024
- Tektronix, Inc.
- Kan Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low frequency S-parameter measurement
- Patent number 11,598,805
- Issue date Mar 7, 2023
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Grant
Combined higher order statistics and artificial intelligence signal...
- Patent number 11,449,697
- Issue date Sep 20, 2022
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Jitter insertion system for waveform generation
- Patent number 11,422,584
- Issue date Aug 23, 2022
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Digital signal processing waveform synthesis for fixed sample rate...
- Patent number 11,146,280
- Issue date Oct 12, 2021
- Tektronix, Inc.
- Gregory A. Martin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Passive variable continuous time linear equalizer with attenuation...
- Patent number 10,904,042
- Issue date Jan 26, 2021
- Tektronix, Inc.
- John J. Pickerd
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for de-embedding a combiner from a balanced si...
- Patent number 10,895,588
- Issue date Jan 19, 2021
- Tektronix, Inc.
- John J. Pickerd
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Noise reduction in digitizing systems
- Patent number 10,502,763
- Issue date Dec 10, 2019
- Tektronix, Inc.
- Barton T. Hickman
- G01 - MEASURING TESTING
Information Patent Grant
Multi-band noise reduction systems and methods
- Patent number 10,432,434
- Issue date Oct 1, 2019
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Grant
Group delay based averaging
- Patent number 10,345,339
- Issue date Jul 9, 2019
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition probe storing compressed or compressed and filte...
- Patent number 10,330,700
- Issue date Jun 25, 2019
- Tektronix, Inc.
- Richard A. Booman
- G01 - MEASURING TESTING
Information Patent Grant
Offset stacked compressor amplifiers in a discrete digitizer system...
- Patent number 10,274,520
- Issue date Apr 30, 2019
- Tektronix, Inc.
- John J. Pickerd
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
S-parameter measurements using real-time oscilloscopes
- Patent number 10,145,874
- Issue date Dec 4, 2018
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Grant
Variable passive network noise filter for noise reduction
- Patent number 10,097,222
- Issue date Oct 9, 2018
- Tektronix, Inc.
- John J. Pickerd
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Serial data link measurement and simulation system
- Patent number 10,073,750
- Issue date Sep 11, 2018
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Band overlay separator
- Patent number 9,933,458
- Issue date Apr 3, 2018
- Tektronix, Inc.
- John J. Pickerd
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for probe equalization
- Patent number 9,772,391
- Issue date Sep 26, 2017
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Grant
Device and method to prevent inter-system interference
- Patent number 9,599,639
- Issue date Mar 21, 2017
- Tektronix, Inc.
- John J. Pickerd
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Test and measurement instrument including asynchronous time-interle...
- Patent number 9,432,042
- Issue date Aug 30, 2016
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Harmonic time domain interleave to extend arbitrary waveform genera...
- Patent number 9,407,280
- Issue date Aug 2, 2016
- Tektronix, Inc.
- John J. Pickerd
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Signal acquisition probe storing compressed or compressed and filte...
- Patent number 9,140,723
- Issue date Sep 22, 2015
- Tektronix, Inc.
- Richard A. Booman
- G01 - MEASURING TESTING
Information Patent Grant
Harmonic time domain interleave to extend oscilloscope bandwidth an...
- Patent number 8,928,514
- Issue date Jan 6, 2015
- Tektronix, Inc.
- John J. Pickerd
- G04 - HOROLOGY
Information Patent Grant
Re-sampling S-parameters for serial data link analysis
- Patent number 8,891,603
- Issue date Nov 18, 2014
- Tektronix, Inc.
- Kan Tan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method of calibrating interleaved digitizer channels
- Patent number 8,788,234
- Issue date Jul 22, 2014
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for generating a test signal with emulated cro...
- Patent number 8,650,010
- Issue date Feb 11, 2014
- Tektronix, Inc.
- Parthasarathy Raju M
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARAL...
- Publication number 20240353491
- Publication date Oct 24, 2024
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED CHANNEL CHARACTERIZATION FOR MACHINE-LEARNING-BASED RIS-A...
- Publication number 20240243779
- Publication date Jul 18, 2024
- Tektronix, Inc.
- Kan Tan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEMS AND METHODS FOR TUNING AND MEASURING A DEVICE UNDER TEST US...
- Publication number 20240235669
- Publication date Jul 11, 2024
- Tektronix, Inc.
- John J. Pickerd
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL TRANSCEIVER TUNING USING MACHINE LEARNING
- Publication number 20240214068
- Publication date Jun 27, 2024
- Tektronix, Inc.
- Evan Douglas Smith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING MODEL DISTRIBUTION ARCHITECTURE
- Publication number 20240184637
- Publication date Jun 6, 2024
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEROPERABILITY PREDICTOR USING MACHINE LEARNING AND REPOSITORY OF...
- Publication number 20240168471
- Publication date May 23, 2024
- Tektronix, Inc.
- Kan Tan
- G05 - CONTROLLING REGULATING
Information Patent Application
METHODS FOR 3D TENSOR BUILDER FOR INPUT TO MACHINE LEARNING
- Publication number 20240169210
- Publication date May 23, 2024
- Tektronix, Inc.
- Kan TAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPREHENSIVE MACHINE LEARNING MODEL DEFINITION
- Publication number 20240126221
- Publication date Apr 18, 2024
- Tektronix, Inc.
- John J. Pickerd
- G05 - CONTROLLING REGULATING
Information Patent Application
RUNTIME DATA COLLECTION AND MONITORING IN MACHINE LEARNING SYSTEMS
- Publication number 20240028002
- Publication date Jan 25, 2024
- Tektronix, Inc.
- Wenzheng Sun
- G05 - CONTROLLING REGULATING
Information Patent Application
MACHINE LEARNING FOR MEASUREMENT USING LINEAR RESPONSE EXTRACTED FR...
- Publication number 20230408558
- Publication date Dec 21, 2023
- Tektronix, Inc.
- Kan TAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEPARATING NOISE TO INCREASE MACHINE LEARNING PREDICTION ACCURACY I...
- Publication number 20230408550
- Publication date Dec 21, 2023
- Tektronix, Inc.
- John J. PICKERD
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED CAVITY FILTER TUNING USING MACHINE LEARNING
- Publication number 20230398694
- Publication date Dec 14, 2023
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TUNING A DEVICE UNDER TEST USING PARALLEL PIPELINE MACHINE LEARNING...
- Publication number 20230314498
- Publication date Oct 5, 2023
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC DEFECT DETECTION AND CLASSIFICATION SYSTEM USING MACHINE...
- Publication number 20230306578
- Publication date Sep 28, 2023
- SONIX, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR AUTOMATED DEFECT DETECTION
- Publication number 20230153989
- Publication date May 18, 2023
- SONIX, Inc.
- Kevin Ryan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR DEVELOPING MACHINE LEARNING MODELS FOR TESTIN...
- Publication number 20230098379
- Publication date Mar 30, 2023
- Tektronix, Inc.
- Mark Anderson Smith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIGITAL TWIN WITH MACHINE LEARNING WAVEFORM GENERATION INCLUDING PA...
- Publication number 20230057479
- Publication date Feb 23, 2023
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING FOR TAPS TO ACCELERATE TDECQ AND OTHER MEASUREMENTS
- Publication number 20230050162
- Publication date Feb 16, 2023
- Tektronix, Inc.
- Kan TAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMBINED TDECQ MEASUREMENT AND TRANSMITTER TUNING USING MACHINE LEA...
- Publication number 20230050303
- Publication date Feb 16, 2023
- Tektronix, Inc.
- John J. PICKERD
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SWEPT PARAMETER OSCILLOSCOPE
- Publication number 20230019734
- Publication date Jan 19, 2023
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERAL DIGITAL SIGNAL PROCESSING WAVEFORM MACHINE LEARNING CONTROL...
- Publication number 20220390515
- Publication date Dec 8, 2022
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
BIT ERROR RATIO ESTIMATION USING MACHINE LEARNING
- Publication number 20220373597
- Publication date Nov 24, 2022
- Tektronix, Inc.
- Maria Agoston
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SHORT PATTERN WAVEFORM DATABASE BASED MACHINE LEARNING FOR MEASUREMENT
- Publication number 20220373598
- Publication date Nov 24, 2022
- Tektronix, Inc.
- Kan TAN
- G01 - MEASURING TESTING
Information Patent Application
REAL-EQUIVALENT-TIME FLASH ARRAY DIGITIZER OSCILLOSCOPE ARCHITECTURE
- Publication number 20220334180
- Publication date Oct 20, 2022
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL TRANSCEIVER TUNING USING MACHINE LEARNING
- Publication number 20220311514
- Publication date Sep 29, 2022
- Tektronix, Inc.
- Evan Douglas Smith
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL TRANSMITTER TUNING USING MACHINE LEARNING AND REFERENCE PAR...
- Publication number 20220311513
- Publication date Sep 29, 2022
- Tektronix, Inc.
- John J. Pickerd
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST AND MEASUREMENT SYSTEM
- Publication number 20220268839
- Publication date Aug 25, 2022
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
EYE CLASSES SEPARATOR WITH OVERLAY, AND COMPOSITE, AND DYNAMIC EYE-...
- Publication number 20220247648
- Publication date Aug 4, 2022
- Tektronix, Inc.
- John J. Pickerd
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MONO CHANNEL BURST CLASSIFICATION USING MACHINE LEARNING
- Publication number 20220036238
- Publication date Feb 3, 2022
- Tektronix, Inc.
- Karthikeyan R
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR MULTI-LEVEL SIGNAL CYCLIC LOOP IMAGE REPRESEN...
- Publication number 20210389373
- Publication date Dec 16, 2021
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING

John J. Pickerd

Person

Patents Grantslast 30 patents

Cyclic loop image representation for waveform data

Swept parameter oscilloscope

Combined TDECQ measurement and transmitter tuning using machine lea...

Optical transmitter tuning using machine learning and reference par...

Optical transceiver tuning using machine learning

Machine learning for taps to accelerate TDECQ and other measurements

Low frequency S-parameter measurement

Combined higher order statistics and artificial intelligence signal...

Jitter insertion system for waveform generation

Digital signal processing waveform synthesis for fixed sample rate...

Passive variable continuous time linear equalizer with attenuation...

Apparatus and method for de-embedding a combiner from a balanced si...

Noise reduction in digitizing systems

Multi-band noise reduction systems and methods

Group delay based averaging

Signal acquisition probe storing compressed or compressed and filte...

Offset stacked compressor amplifiers in a discrete digitizer system...

S-parameter measurements using real-time oscilloscopes

Variable passive network noise filter for noise reduction

Serial data link measurement and simulation system

Band overlay separator

Method for probe equalization

Device and method to prevent inter-system interference

Test and measurement instrument including asynchronous time-interle...

Harmonic time domain interleave to extend arbitrary waveform genera...

Signal acquisition probe storing compressed or compressed and filte...

Harmonic time domain interleave to extend oscilloscope bandwidth an...

Re-sampling S-parameters for serial data link analysis

Method of calibrating interleaved digitizer channels

Apparatus and method for generating a test signal with emulated cro...

Patents Applicationslast 30 patents

OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARAL...

AUTOMATED CHANNEL CHARACTERIZATION FOR MACHINE-LEARNING-BASED RIS-A...

SYSTEMS AND METHODS FOR TUNING AND MEASURING A DEVICE UNDER TEST US...

OPTICAL TRANSCEIVER TUNING USING MACHINE LEARNING

MACHINE LEARNING MODEL DISTRIBUTION ARCHITECTURE

INTEROPERABILITY PREDICTOR USING MACHINE LEARNING AND REPOSITORY OF...

METHODS FOR 3D TENSOR BUILDER FOR INPUT TO MACHINE LEARNING

COMPREHENSIVE MACHINE LEARNING MODEL DEFINITION

RUNTIME DATA COLLECTION AND MONITORING IN MACHINE LEARNING SYSTEMS

MACHINE LEARNING FOR MEASUREMENT USING LINEAR RESPONSE EXTRACTED FR...

SEPARATING NOISE TO INCREASE MACHINE LEARNING PREDICTION ACCURACY I...

AUTOMATED CAVITY FILTER TUNING USING MACHINE LEARNING

TUNING A DEVICE UNDER TEST USING PARALLEL PIPELINE MACHINE LEARNING...

ULTRASONIC DEFECT DETECTION AND CLASSIFICATION SYSTEM USING MACHINE...

METHOD AND APPARATUS FOR AUTOMATED DEFECT DETECTION

SYSTEM AND METHOD FOR DEVELOPING MACHINE LEARNING MODELS FOR TESTIN...

DIGITAL TWIN WITH MACHINE LEARNING WAVEFORM GENERATION INCLUDING PA...

MACHINE LEARNING FOR TAPS TO ACCELERATE TDECQ AND OTHER MEASUREMENTS

COMBINED TDECQ MEASUREMENT AND TRANSMITTER TUNING USING MACHINE LEA...

SWEPT PARAMETER OSCILLOSCOPE

GENERAL DIGITAL SIGNAL PROCESSING WAVEFORM MACHINE LEARNING CONTROL...

BIT ERROR RATIO ESTIMATION USING MACHINE LEARNING

SHORT PATTERN WAVEFORM DATABASE BASED MACHINE LEARNING FOR MEASUREMENT

REAL-EQUIVALENT-TIME FLASH ARRAY DIGITIZER OSCILLOSCOPE ARCHITECTURE

OPTICAL TRANSCEIVER TUNING USING MACHINE LEARNING

OPTICAL TRANSMITTER TUNING USING MACHINE LEARNING AND REFERENCE PAR...

TEST AND MEASUREMENT SYSTEM

EYE CLASSES SEPARATOR WITH OVERLAY, AND COMPOSITE, AND DYNAMIC EYE-...

MONO CHANNEL BURST CLASSIFICATION USING MACHINE LEARNING

SYSTEM AND METHOD FOR MULTI-LEVEL SIGNAL CYCLIC LOOP IMAGE REPRESEN...