John K. Geist

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Scottsdale, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Loop-back probe test and verification method
- Patent number 10,768,206
- Issue date Sep 8, 2020
- Integrated Technology Corporation
- Rodney E. Schwartz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LOOP-BACK PROBE TEST AND VERIFICATION METHOD
- Publication number 20160377657
- Publication date Dec 29, 2016
- INTEGRATED TECHNOLOGY CORPORATION
- Rodney E. Schwartz
- G01 - MEASURING TESTING