John K. Gritters

Person

Livermore, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Non-linear vertical leaf spring
- Patent number 9,702,904
- Issue date Jul 11, 2017
- FormFactor, Inc.
- Keith J. Breinlinger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Elastic encapsulated carbon nanotube based electrical contacts
- Patent number 8,872,176
- Issue date Oct 28, 2014
- FormFactor, Inc.
- Treliant Fang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Carbon nanotube contact structures for use with semiconductor dies...
- Patent number 8,756,802
- Issue date Jun 24, 2014
- FormFactor, Inc.
- John K. Gritters
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fuel cell using carbon nanotubes
- Patent number 8,697,301
- Issue date Apr 15, 2014
- FormFactor, Inc.
- Benjamin N. Eldridge
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Process for fabricating MEMS devices
- Patent number 8,691,099
- Issue date Apr 8, 2014
- John Gritters
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Single support structure probe group with staggered mounting pattern
- Patent number 8,203,352
- Issue date Jun 19, 2012
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING
Information Patent Grant
Process of positioning groups of contact structures
- Patent number 8,148,646
- Issue date Apr 3, 2012
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING
Information Patent Grant
Switch for use in microelectromechanical systems (MEMS) and MEMS de...
- Patent number 8,138,859
- Issue date Mar 20, 2012
- FormFactor, Inc.
- John K. Gritters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card assembly with carbon nanotube probes having a spring mec...
- Patent number 8,130,007
- Issue date Mar 6, 2012
- FormFactor, Inc.
- Benjamin N. Eldridge
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Microspring array having reduced pitch contact elements
- Patent number 8,115,504
- Issue date Feb 14, 2012
- FormFactor, Inc.
- John K. Gritters
- G01 - MEASURING TESTING
Information Patent Grant
MEMS device with two axes comb drive actuators
- Patent number 7,872,394
- Issue date Jan 18, 2011
- John Gritters
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Single support structure probe group with staggered mounting pattern
- Patent number 7,782,072
- Issue date Aug 24, 2010
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING
Information Patent Grant
Carbon nanotube contact structures
- Patent number 7,731,503
- Issue date Jun 8, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Contactor having a global spring structure and methods of making an...
- Patent number 7,688,085
- Issue date Mar 30, 2010
- FormFactor, Inc.
- John K. Gritters
- G01 - MEASURING TESTING
Information Patent Grant
Resilient contact element and methods of fabrication
- Patent number 7,674,112
- Issue date Mar 9, 2010
- FormFactor, Inc.
- John K. Gritters
- G01 - MEASURING TESTING
Information Patent Grant
Reinforced contact elements
- Patent number 7,628,620
- Issue date Dec 8, 2009
- FormFactor, Inc.
- John K. Gritters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe structures with physically suspended electronic components
- Patent number 7,579,856
- Issue date Aug 25, 2009
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Grant
Extended probe tips
- Patent number 7,528,618
- Issue date May 5, 2009
- FormFactor, Inc.
- John K. Gritters
- G01 - MEASURING TESTING
Information Patent Grant
Reinforced contact elements
- Patent number 7,384,277
- Issue date Jun 10, 2008
- FormFactor, Inc.
- John K. Gritters
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Carbon Nanotube Contact Structures For Use With Semiconductor Dies...
- Publication number 20130140057
- Publication date Jun 6, 2013
- FormFactor, Inc.
- John K. Gritters
- B82 - NANO-TECHNOLOGY
Information Patent Application
Non-Linear Vertical Leaf Spring
- Publication number 20120242363
- Publication date Sep 27, 2012
- FormFactor, Inc.
- Keith J. Breinlinger
- G01 - MEASURING TESTING
Information Patent Application
ELASTIC ENCAPSULATED CARBON NANOTUBE BASED ELECTRICAL CONTACTS
- Publication number 20120086004
- Publication date Apr 12, 2012
- FormFactor, Inc.
- Treliant Fang
- G01 - MEASURING TESTING
Information Patent Application
FUEL CELL USING CARBON NANOTUBES
- Publication number 20110189564
- Publication date Aug 4, 2011
- FormFactor, Inc.
- Benjamin N. Eldridge
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Process for fabricating MEMS devices
- Publication number 20110136283
- Publication date Jun 9, 2011
- John Gritters
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SINGLE SUPPORT STRUCTURE PROBE GROUP WITH STAGGERED MOUNTING PATTERN
- Publication number 20100315111
- Publication date Dec 16, 2010
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING
Information Patent Application
CARBON NANOTUBE CONTACT STRUCTURES FOR USE WITH SEMICONDUCTOR DIES...
- Publication number 20100252317
- Publication date Oct 7, 2010
- FormFactor, Inc.
- John K. Gritters
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PRINTED SOLAR PANEL
- Publication number 20100154861
- Publication date Jun 24, 2010
- FormFactor, Inc.
- John K. Gritters
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Process For Manufacturing Contact Elements For Probe Card Assembles
- Publication number 20100140793
- Publication date Jun 10, 2010
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING
Information Patent Application
MICROSPRING ARRAY HAVING REDUCED PITCH CONTACT ELEMENTS
- Publication number 20100141290
- Publication date Jun 10, 2010
- FormFactor, Inc.
- John K. Gritters
- G01 - MEASURING TESTING
Information Patent Application
CARBON NANOTUBE CONTACT STRUCTURES
- Publication number 20100112828
- Publication date May 6, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Process of Positioning Groups of Contact Structures
- Publication number 20100078206
- Publication date Apr 1, 2010
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING
Information Patent Application
SWITCH FOR USE IN MICROELECTROMECHANICAL SYSTEMS (MEMS) AND MEMS DE...
- Publication number 20090260960
- Publication date Oct 22, 2009
- FormFactor, Inc.
- John K. Gritters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCED SCRUB CONTACT ELEMENT
- Publication number 20090079455
- Publication date Mar 26, 2009
- FormFactor, Inc.
- John K. Gritters
- G01 - MEASURING TESTING
Information Patent Application
Making And Using Carbon Nanotube Probes
- Publication number 20090066352
- Publication date Mar 12, 2009
- FormFactor, Inc.
- John K. Gritters
- G01 - MEASURING TESTING
Information Patent Application
REINFORCED CONTACT ELEMENTS
- Publication number 20080238467
- Publication date Oct 2, 2008
- FormFactor, Inc.
- John K. Gritters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RESILIENT CONTACT ELEMENT AND METHODS OF FABRICATION
- Publication number 20080157799
- Publication date Jul 3, 2008
- FormFactor, Inc.
- John K. Gritters
- G01 - MEASURING TESTING
Information Patent Application
REINFORCED CONTACT ELEMENTS
- Publication number 20080143359
- Publication date Jun 19, 2008
- FormFactor, Inc.
- John K. Gritters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE SUPPORT STRUCTURE PROBE GROUP WITH STAGGERED MOUNTING PATTERN
- Publication number 20080074132
- Publication date Mar 27, 2008
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING
Information Patent Application
CONTACTOR HAVING A GLOBAL SPRING STRUCTURE AND METHODS OF MAKING AN...
- Publication number 20070296433
- Publication date Dec 27, 2007
- FormFactor, Inc.
- John K. Gritters
- G01 - MEASURING TESTING
Information Patent Application
Extended Probe Tips
- Publication number 20070259456
- Publication date Nov 8, 2007
- FormFactor, Inc.
- John K. Gritters
- G01 - MEASURING TESTING
Information Patent Application
Probe Structures With Electronic Components
- Publication number 20070247175
- Publication date Oct 25, 2007
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Application
A PROBE ARRAY STRUCTURE AND A METHOD OF MAKING A PROBE ARRAY STRUCTURE
- Publication number 20070152685
- Publication date Jul 5, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Assembly with a detachable member
- Publication number 20060132153
- Publication date Jun 22, 2006
- FormFactor, Inc.
- John K. Gritters
- G01 - MEASURING TESTING

John K. Gritters

Person

Patents Grantslast 30 patents

Non-linear vertical leaf spring

Elastic encapsulated carbon nanotube based electrical contacts

Carbon nanotube contact structures for use with semiconductor dies...

Fuel cell using carbon nanotubes

Process for fabricating MEMS devices

Single support structure probe group with staggered mounting pattern

Process of positioning groups of contact structures

Switch for use in microelectromechanical systems (MEMS) and MEMS de...

Probe card assembly with carbon nanotube probes having a spring mec...

Microspring array having reduced pitch contact elements

MEMS device with two axes comb drive actuators

Single support structure probe group with staggered mounting pattern

Carbon nanotube contact structures

Contactor having a global spring structure and methods of making an...

Resilient contact element and methods of fabrication

Reinforced contact elements

Probe structures with physically suspended electronic components

Extended probe tips

Reinforced contact elements

Patents Applicationslast 30 patents

Carbon Nanotube Contact Structures For Use With Semiconductor Dies...

Non-Linear Vertical Leaf Spring

ELASTIC ENCAPSULATED CARBON NANOTUBE BASED ELECTRICAL CONTACTS

FUEL CELL USING CARBON NANOTUBES

Process for fabricating MEMS devices

SINGLE SUPPORT STRUCTURE PROBE GROUP WITH STAGGERED MOUNTING PATTERN

CARBON NANOTUBE CONTACT STRUCTURES FOR USE WITH SEMICONDUCTOR DIES...

PRINTED SOLAR PANEL

Process For Manufacturing Contact Elements For Probe Card Assembles

MICROSPRING ARRAY HAVING REDUCED PITCH CONTACT ELEMENTS

CARBON NANOTUBE CONTACT STRUCTURES

Process of Positioning Groups of Contact Structures

SWITCH FOR USE IN MICROELECTROMECHANICAL SYSTEMS (MEMS) AND MEMS DE...

REDUCED SCRUB CONTACT ELEMENT

Making And Using Carbon Nanotube Probes

REINFORCED CONTACT ELEMENTS

RESILIENT CONTACT ELEMENT AND METHODS OF FABRICATION

REINFORCED CONTACT ELEMENTS

SINGLE SUPPORT STRUCTURE PROBE GROUP WITH STAGGERED MOUNTING PATTERN

CONTACTOR HAVING A GLOBAL SPRING STRUCTURE AND METHODS OF MAKING AN...

Extended Probe Tips

Probe Structures With Electronic Components

A PROBE ARRAY STRUCTURE AND A METHOD OF MAKING A PROBE ARRAY STRUCTURE

Assembly with a detachable member