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John KIM

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  • Bridgewater, NJ, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Oscillator apparatus
    • Patent number 11,953,417
    • Issue date Apr 9, 2024
    • Nokia Technologies Oy
    • John D. Kim
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Transducer array
    • Patent number 11,525,807
    • Issue date Dec 13, 2022
    • Nokia Technologies Oy
    • John Kim
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    APPARATUS AND SYSTEM FOR COOLING
    • Publication number 20240023282
    • Publication date Jan 18, 2024
    • Accelsius, LLC
    • Raffaele Luca AMALFI
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    Apparatus and Methods for Coolant Distribution
    • Publication number 20230375279
    • Publication date Nov 23, 2023
    • Seguente, Inc.
    • John Kim
    • F28 - HEAT EXCHANGE IN GENERAL
  • Information Patent Application

    Manifold Systems, Devices, and Methods for Thermal Management of Ha...
    • Publication number 20230380114
    • Publication date Nov 23, 2023
    • Seguente, Inc.
    • Raffaele Luca Amalfi
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    SENSING APPARATUS
    • Publication number 20230116706
    • Publication date Apr 13, 2023
    • Nokia Technologies Oy
    • John D. KIM
    • A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
  • Information Patent Application

    Apparatus and Electronic Device for Analysing Samples
    • Publication number 20230022568
    • Publication date Jan 26, 2023
    • Nokia Technologies Oy
    • John Kim
    • G01 - MEASURING TESTING
  • Information Patent Application

    OSCILLATOR APPARATUS
    • Publication number 20220099549
    • Publication date Mar 31, 2022
    • Nokia Technologies Oy
    • John D. KIM
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Transducer Array
    • Publication number 20210364470
    • Publication date Nov 25, 2021
    • Nokia Technologies Oy
    • John KIM
    • G01 - MEASURING TESTING