John Kirkland

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for generation of wafer inspection critical areas
- Patent number 11,410,291
- Issue date Aug 9, 2022
- KLA Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generation of wafer inspection critical areas
- Patent number 10,706,522
- Issue date Jul 7, 2020
- KLA-Tencor Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Generation of Wafer Inspection Critical Areas
- Publication number 20200334807
- Publication date Oct 22, 2020
- KLA Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Generation of Wafer Inspection Critical Areas
- Publication number 20180130195
- Publication date May 10, 2018
- KLA-Tencor Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING