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John L. Crowley
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Fremont, CA, US
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last 30 patents
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Patent Grant
Apparatus and method for compensating for errors in temperature mea...
Patent number
4,984,902
Issue date
Jan 15, 1991
Peak Systems, Inc.
John L. Crowley
G01 - MEASURING TESTING
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Patent Grant
Apparatus and method for compensating for errors in temperature mea...
Patent number
4,969,748
Issue date
Nov 13, 1990
Peak Systems, Inc.
John L. Crowley
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor wafer heating chamber
Patent number
4,755,654
Issue date
Jul 5, 1988
John L. Crowley
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...