John L. Nethery Jr.

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe for an apparatus for analyzing metals by X-ray fluorescence
- Patent number 4,686,694
- Issue date Aug 11, 1987
- Ramsey Engineering Company
- Peter F. Berry
- G01 - MEASURING TESTING
Information Patent Grant
Portable apparatus for analyzing metals by X-ray fluorescence
- Patent number 4,429,409
- Issue date Jan 31, 1984
- Ramsey Engineering Company
- Peter F. Berry
- G01 - MEASURING TESTING