John Lafferty

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Colchester, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Applying parametric test patterns for high pin count ASICs on low p...
- Patent number 6,847,203
- Issue date Jan 25, 2005
- International Business Machines Corporation
- Dennis R. Conti
- G01 - MEASURING TESTING
Information Patent Grant
Automatic construction of conditional exponential models from eleme...
- Patent number 6,304,841
- Issue date Oct 16, 2001
- International Business Machines Corporation
- Adam Lee Berger
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
APPLYING PARAMETRIC TEST PATTERNS FOR HIGH PIN COUNT ASICS ON LOW P...
- Publication number 20050001611
- Publication date Jan 6, 2005
- International Business Machines Corporation
- Dennis R. Conti
- G01 - MEASURING TESTING