John Laurence Niven

Person

Livermore, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for reducing temperature variation during burn in
- Patent number 8,843,344
- Issue date Sep 23, 2014
- Eric Chen-Li Sheng
- G01 - MEASURING TESTING
Information Patent Grant
Controlling temperature in a semiconductor device
- Patent number 7,834,648
- Issue date Nov 16, 2010
- Eric Chen-Li Sheng
- G01 - MEASURING TESTING
Information Patent Grant
System and method for reducing heat dissipation during burn-in
- Patent number 7,595,652
- Issue date Sep 29, 2009
- Eric Chen-Li Sheng
- G01 - MEASURING TESTING
Information Patent Grant
System and method for reducing temperature variation during burn in
- Patent number 7,565,259
- Issue date Jul 21, 2009
- Eric Chen-Li Sheng
- G01 - MEASURING TESTING
Information Patent Grant
System and method for controlling temperature during burn-in
- Patent number 7,463,050
- Issue date Dec 9, 2008
- Transmeta Corporation
- Eric Chen-Li Sheng
- G01 - MEASURING TESTING
Information Patent Grant
System and method for reducing temperature variation during burn in
- Patent number 7,248,988
- Issue date Jul 24, 2007
- Transmeta Corporation
- Eric Chen-Li Sheng
- G01 - MEASURING TESTING
Information Patent Grant
System and method for reducing heat dissipation during burn-in
- Patent number 7,242,205
- Issue date Jul 10, 2007
- Transmeta Corporation
- Eric Chen-Li Sheng
- G01 - MEASURING TESTING
Information Patent Grant
System and method for controlling temperature during burn-in
- Patent number 6,900,650
- Issue date May 31, 2005
- Transmeta Corporation
- Eric Chen-Li Sheng
- G01 - MEASURING TESTING
Information Patent Grant
System and method for reducing heat dissipation during burn-in
- Patent number 6,897,671
- Issue date May 24, 2005
- Transmeta Corporation
- Eric Chen-Li Sheng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR REDUCING TEMPERATURE VARIATION DURING BURN IN
- Publication number 20090316750
- Publication date Dec 24, 2009
- Eric Chen-Li Sheng
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR REDUCING TEMPERATURE VARIATION DURING BURN IN
- Publication number 20090289654
- Publication date Nov 26, 2009
- Eric Chen-Li Sheng
- G01 - MEASURING TESTING
Information Patent Application
System and method for reducing heat dissipation during burn-in
- Publication number 20080024152
- Publication date Jan 31, 2008
- Transmeta Corporation
- Eric Chen-Li Sheng
- G01 - MEASURING TESTING
Information Patent Application
System and method for reducing temperature variation during burn in
- Publication number 20070271061
- Publication date Nov 22, 2007
- Transmeta Corporation
- Eric Chen-Li Sheng
- G01 - MEASURING TESTING
Information Patent Application
System and method for reducing temperature variation during burn in
- Publication number 20050192773
- Publication date Sep 1, 2005
- Eric Chen-Li Sheng
- G01 - MEASURING TESTING

John Laurence Niven

Person

Patents Grantslast 30 patents

System and method for reducing temperature variation during burn in

Controlling temperature in a semiconductor device

System and method for reducing heat dissipation during burn-in

System and method for reducing temperature variation during burn in

System and method for controlling temperature during burn-in

System and method for reducing temperature variation during burn in

System and method for reducing heat dissipation during burn-in

System and method for controlling temperature during burn-in

System and method for reducing heat dissipation during burn-in

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR REDUCING TEMPERATURE VARIATION DURING BURN IN

SYSTEM AND METHOD FOR REDUCING TEMPERATURE VARIATION DURING BURN IN

System and method for reducing heat dissipation during burn-in

System and method for reducing temperature variation during burn in

System and method for reducing temperature variation during burn in