Boulder, CO, US
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GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
Jeeseong Hwang
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Patent Grant
GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
John H. Lehman
G01 - MEASURING TESTING
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The United States of America, as represented by the Secretary of Commerce
Alexandra Artusio-Glimpse
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Patent Grant
The United States of America, as represented by the Secretary of Commerce
John Lehman
G01 - MEASURING TESTING
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Patent Grant
NATIONAL INSTITUTE OF STANDARD AND TECHNOLOGY
John H. Lehman
B82 - NANO-TECHNOLOGY
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Patent Grant
The United States of America as represented by the Secretary of Commerce
John Henry Lehman
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the Secretary of Commerce
John Henry Lehman
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the Secretary of Commerce
John Henry Lehman
E04 - BUILDING
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Patent Grant
The United States of America as represented by the Secretary of Commerce
John Henry Lehman
E04 - BUILDING
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Patent Application
Government of the United States of America, as Represented by the Secretary o...
Jeeseong Hwang
G01 - MEASURING TESTING
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Patent Application
Government of the United States of America, as Represented by the Secretary o...
John H. Lehman
G01 - MEASURING TESTING
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Patent Application
Government of the United States of America, as Represented by the Secretary o...
ALEXANDRA ARTUSIO-GLIMPSE
G01 - MEASURING TESTING
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Patent Application
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
JOHN H. LEHMAN
B82 - NANO-TECHNOLOGY
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Patent Application
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
JOHN LEHMAN
G01 - MEASURING TESTING
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Patent Application
John Henry Lehman
G01 - MEASURING TESTING
