John Lesoine

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Bandgap measurements of patterned film stacks using spectroscopic m...
- Patent number 11,796,390
- Issue date Oct 24, 2023
- KLA Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Grant
Beamsplitter based ellipsometer focusing system
- Patent number 11,385,167
- Issue date Jul 12, 2022
- Onto Innovation Inc.
- John F. Lesoine
- G01 - MEASURING TESTING
Information Patent Grant
Bandgap measurements of patterned film stacks using spectroscopic m...
- Patent number 11,378,451
- Issue date Jul 5, 2022
- KLA Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Grant
Vortex polarimeter
- Patent number 11,346,768
- Issue date May 31, 2022
- Onto Innovation Inc.
- Kenneth E. James
- G01 - MEASURING TESTING
Information Patent Grant
Focus system for oblique optical metrology device
- Patent number 11,346,790
- Issue date May 31, 2022
- Onto Innovation Inc.
- Amit Shachaf
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system calibration refinement
- Patent number 10,605,722
- Issue date Mar 31, 2020
- KLA-Tencor Corporation
- Hidong Kwak
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system calibration refinement
- Patent number 9,857,291
- Issue date Jan 2, 2018
- KLA-Tencor Corporation
- Hidong Kwak
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Bandgap Measurements of Patterned Film Stacks Using Spectroscopic M...
- Publication number 20220349752
- Publication date Nov 3, 2022
- KLA Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Application
FOCUS SYSTEM FOR OBLIQUE OPTICAL METROLOGY DEVICE
- Publication number 20220170865
- Publication date Jun 2, 2022
- ONTO INNOVATION INC.
- Amit SHACHAF
- G01 - MEASURING TESTING
Information Patent Application
VORTEX POLARIMETER
- Publication number 20220170847
- Publication date Jun 2, 2022
- ONTO INNOVATION INC.
- Kenneth E. James
- G01 - MEASURING TESTING
Information Patent Application
BEAMSPLITTER BASED ELLIPSOMETER FOCUSING SYSTEM
- Publication number 20210096062
- Publication date Apr 1, 2021
- ONTO INNOVATION INC.
- John F. Lesoine
- G01 - MEASURING TESTING
Information Patent Application
Bandgap Measurements of Patterned Film Stacks Using Spectroscopic M...
- Publication number 20190041266
- Publication date Feb 7, 2019
- KLA-Tencor Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY SYSTEM CALIBRATION REFINEMENT
- Publication number 20180100796
- Publication date Apr 12, 2018
- KLA-Tencor Corporation
- Hidong Kwak
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY SYSTEM CALIBRATION REFINEMENT
- Publication number 20140340682
- Publication date Nov 20, 2014
- Hidong Kwak
- G01 - MEASURING TESTING