John M. Blondin

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Colchester, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for preventing cross talk and interference in semiconduct...
- Patent number 7,026,806
- Issue date Apr 11, 2006
- International Business Machines Corporation
- John M. Blondin
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test and burn-in apparatus provided with a high curre...
- Patent number 6,921,288
- Issue date Jul 26, 2005
- International Business Machines Corporation
- John M. Blondin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Component carrier having a wave pattern tension reduction surface
- Patent number 6,176,374
- Issue date Jan 23, 2001
- International Business Machines Corporation
- John Michael Blondin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for preventing chip breakage during semiconduc...
- Patent number 6,171,873
- Issue date Jan 9, 2001
- International Business Machines Corporation
- Ronald Lee Mendelson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for preventing chip breakage during semiconduc...
- Patent number 5,888,838
- Issue date Mar 30, 1999
- International Business Machines Corporation
- Ronald Lee Mendelson
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
A SEMICONDUCTOR TEST AND BURN-IN APPARATUS PROVIDED WITH A HIGH CUR...
- Publication number 20050112936
- Publication date May 26, 2005
- International Business Machines Corporation
- John M. Blondin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR PREVENTING CROSS TALK AND INTERFERENCE IN SEMICONDUCT...
- Publication number 20040262603
- Publication date Dec 30, 2004
- International Business Machines Corporation
- John M. Blondin
- G01 - MEASURING TESTING