John M. Lindquist

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Image-to-image registration focused ion beam system
- Patent number 5,541,411
- Issue date Jul 30, 1996
- FEI Company
- John M. Lindquist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Secondary ion mass spectometry system
- Patent number 5,376,791
- Issue date Dec 27, 1994
- FEI Company
- Lynwood W. Swanson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of semiconductor device manufacture
- Patent number 5,188,705
- Issue date Feb 23, 1993
- FEI Company
- Lynwood W. Swanson
- H01 - BASIC ELECTRIC ELEMENTS