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John M. PETERSON
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Hillsboro, OR, US
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Patents Grants
last 30 patents
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Patent Grant
Converged test platforms and processes for class and system testing...
Patent number
10,677,845
Issue date
Jun 9, 2020
Intel Corporation
Abram M. Detofsky
G01 - MEASURING TESTING
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Patent Grant
Systems and methods for wireless device testing
Patent number
10,247,773
Issue date
Apr 2, 2019
Intel Corporation
Sankaran M. Menon
G01 - MEASURING TESTING
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Patent Grant
Integrated circuit testing architecture
Patent number
9,506,980
Issue date
Nov 29, 2016
Intel Corporation
Abram M. Detofsky
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
CONVERGED TEST PLATFORMS AND PROCESSES FOR CLASS AND SYSTEM TESTING...
Publication number
20180252772
Publication date
Sep 6, 2018
Intel Corporation
Abram M. Detofsky
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR WIRELESS DEVICE TESTING
Publication number
20180003764
Publication date
Jan 4, 2018
Intel Corporation
Sankaran M. Menon
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT TESTING ARCHITECTURE
Publication number
20140266285
Publication date
Sep 18, 2014
Abram M. DETOFSKY
G01 - MEASURING TESTING