John M. Walsh

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New Windsor, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Atom probe tomography sample preparation for three-dimensional (3D)...
- Patent number 9,279,849
- Issue date Mar 8, 2016
- International Business Machines Corporation
- Terence L. Kane
- G01 - MEASURING TESTING
Information Patent Grant
Atom probe tomography sample preparation for three-dimensional (3D)...
- Patent number 9,201,112
- Issue date Dec 1, 2015
- International Business Machines Corporation
- Terence L. Kane
- G01 - MEASURING TESTING
Information Patent Grant
Prioritization of search requests using search templates
- Patent number 8,185,512
- Issue date May 22, 2012
- International Business Machines Corporation
- Richard Joseph Brodfuehrer
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ATOM PROBE TOMOGRAPHY SAMPLE PREPARATION FOR THREE-DIMENSIONAL (3D)...
- Publication number 20150355266
- Publication date Dec 10, 2015
- International Business Machines Corporation
- Terence L. Kane
- G01 - MEASURING TESTING
Information Patent Application
ATOM PROBE TOMOGRAPHY SAMPLE PREPARATION FOR THREE-DIMENSIONAL (3D)...
- Publication number 20150160286
- Publication date Jun 11, 2015
- International Business Machines Corporation
- Terence L. Kane
- G01 - MEASURING TESTING
Information Patent Application
PRIORITIZATION OF SEARCH REQUESTS USING SEARCH TEMPLATES
- Publication number 20100145977
- Publication date Jun 10, 2010
- International Business Machines Corporation
- Richard Joseph Brodfuehrer
- G06 - COMPUTING CALCULATING COUNTING