John Mark Oonk

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San Ramon, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for enabling the measurement of device under test...
- Patent number 7,492,181
- Issue date Feb 17, 2009
- Credence Systems Corporation
- Laurence Crosby
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing memories with redundant storage elements
- Patent number 6,862,703
- Issue date Mar 1, 2005
- Credence Systems Corporation
- John Mark Oonk
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit tester having a program status memory
- Patent number 6,380,730
- Issue date Apr 30, 2002
- Credence Systems Corporation
- Brian J. Arkin
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit tester having pattern generator controlled data bus
- Patent number 6,202,186
- Issue date Mar 13, 2001
- Credence Systems Corporation
- John Mark Oonk
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus for testing memories with redundant storage elements
- Publication number 20030033561
- Publication date Feb 13, 2003
- John Mark Oonk
- G11 - INFORMATION STORAGE