John Mark Thornell

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Plano, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for inspection using off-angle lighting
- Patent number 7,024,031
- Issue date Apr 4, 2006
- August Technology Corp.
- Ramiro Castellanos-Nolasco
- G01 - MEASURING TESTING
Information Patent Grant
System and method for locating image features
- Patent number 6,744,913
- Issue date Jun 1, 2004
- Semiconductor Technology & Instruments, Inc.
- Clyde Maxwell Guest
- G06 - COMPUTING CALCULATING COUNTING