John Marohn

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Ithaca, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Atomic force microscopy apparatus, methods, and applications
- Patent number 11,808,783
- Issue date Nov 7, 2023
- Cornell University
- John Marohn
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy apparatus, methods, and applications
- Patent number 11,175,306
- Issue date Nov 16, 2021
- Cornell University
- John Marohn
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ATOMIC FORCE MICROSCOPY APPARATUS, METHODS, AND APPLICATIONS
- Publication number 20220043024
- Publication date Feb 10, 2022
- Cornell University
- John Marohn
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY APPARATUS, METHODS, AND APPLICATIONS
- Publication number 20200204112
- Publication date Jun 25, 2020
- Cornell University
- John Marohn
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER