John Martin Mclntosh

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Orlando, FL, US

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Patents Applicationslast 30 patents

Information Patent Application
Substrate topography compensation at mask design: 3D OPC topography...
- Publication number 20040058255
- Publication date Mar 25, 2004
- Scott Jessen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Calibration standard for high resolution electron microscopy
- Publication number 20030193022
- Publication date Oct 16, 2003
- Erik Cho Houge
- G01 - MEASURING TESTING
Information Patent Application
Mass spectrometer particle counter
- Publication number 20020063201
- Publication date May 30, 2002
- Erik Cho Houge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-ray system
- Publication number 20010043667
- Publication date Nov 22, 2001
- Michael Antonell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING