John Matthew Long

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Doorbell system with pulse-driven boost rectifier
- Patent number 10,692,334
- Issue date Jun 23, 2020
- Logitech Europe S.A.
- John M. Long
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Doorbell system with pulse-driven boost rectifier
- Patent number 10,311,685
- Issue date Jun 4, 2019
- Logitech Europe S.A.
- John M. Long
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Closed-grid bus architecture for wafer interconnect structure
- Patent number 7,960,990
- Issue date Jun 14, 2011
- FormFactor, Inc.
- Charles A. Miller
- G11 - INFORMATION STORAGE
Information Patent Grant
System for measuring signal path resistance for an integrated circu...
- Patent number 7,609,082
- Issue date Oct 27, 2009
- FormFactor, Inc.
- John M. Long
- G01 - MEASURING TESTING
Information Patent Grant
Closed-grid bus architecture for wafer interconnect structure
- Patent number 7,508,227
- Issue date Mar 24, 2009
- FormFactor, Inc.
- Charles A. Miller
- G11 - INFORMATION STORAGE
Information Patent Grant
System for measuring signal path resistance for an integrated circu...
- Patent number 7,486,095
- Issue date Feb 3, 2009
- FormFactor, Inc.
- John M. Long
- G01 - MEASURING TESTING
Information Patent Grant
Probe head arrays
- Patent number 7,282,933
- Issue date Oct 16, 2007
- FormFactor, Inc.
- Roy John Henson
- G01 - MEASURING TESTING
Information Patent Grant
Closed-grid bus architecture for wafer interconnect structure
- Patent number 7,276,922
- Issue date Oct 2, 2007
- FormFactor, Inc.
- Charles A. Miller
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of incorporating interconnect systems into an integrated cir...
- Patent number 7,257,796
- Issue date Aug 14, 2007
- FormFactor, Inc.
- Charles A. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for measuring signal path resistance for an integrated circu...
- Patent number 7,109,736
- Issue date Sep 19, 2006
- FormFactor, Inc.
- John M. Long
- G01 - MEASURING TESTING
Information Patent Grant
Method of designing, fabricating, testing and interconnecting an IC...
- Patent number 6,845,491
- Issue date Jan 18, 2005
- FormFactor, Inc.
- Charles A. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Closed-grid bus architecture for wafer interconnect structure
- Patent number 6,784,677
- Issue date Aug 31, 2004
- FormFactor, Inc.
- Charles A. Miller
- G11 - INFORMATION STORAGE
Information Patent Grant
System for measuring signal path resistance for an integrated circu...
- Patent number 6,677,744
- Issue date Jan 13, 2004
- FormFactor, Inc.
- John Long
- G01 - MEASURING TESTING
Information Patent Grant
Closed-grid bus architecture for wafer interconnect structure
- Patent number 6,603,323
- Issue date Aug 5, 2003
- FormFactor, Inc.
- Charles A. Miller
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of designing, fabricating, testing and interconnecting an IC...
- Patent number 6,539,531
- Issue date Mar 25, 2003
- FormFactor, Inc.
- Charles A. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for testing real and simulated versions of an integrated cir...
- Patent number 6,295,623
- Issue date Sep 25, 2001
- Credence Systems Corporation
- Gary J. Lesmeister
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DOORBELL SYSTEM WITH ENERGY STORAGE DEVICE
- Publication number 20210183213
- Publication date Jun 17, 2021
- Aron Rosenberg
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DOORBELL SYSTEM WITH ENERGY STORAGE DEVICE
- Publication number 20200388118
- Publication date Dec 10, 2020
- Aron Rosenberg
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DOORBELL SYSTEM WITH PULSE-DRIVEN BOOST RECTIFIER
- Publication number 20200005604
- Publication date Jan 2, 2020
- Logitech Europe S.A.
- John M. Long
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Application
CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE
- Publication number 20100264947
- Publication date Oct 21, 2010
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE
- Publication number 20090179659
- Publication date Jul 16, 2009
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR MEASURING SIGNAL PATH RESISTANCE FOR AN INTEGRATED CIRCU...
- Publication number 20090134905
- Publication date May 28, 2009
- FormFactor, Inc.
- John Long
- G01 - MEASURING TESTING
Information Patent Application
CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE
- Publication number 20080024143
- Publication date Jan 31, 2008
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
System For Measuring Signal Path Resistance For An Integrated Circu...
- Publication number 20070007989
- Publication date Jan 11, 2007
- FormFactor, Inc.
- John Long
- G01 - MEASURING TESTING
Information Patent Application
Probe head arrays
- Publication number 20060145713
- Publication date Jul 6, 2006
- Roy John Henson
- G01 - MEASURING TESTING
Information Patent Application
Method of incorporating interconnect systems into an integrated cir...
- Publication number 20050125751
- Publication date Jun 9, 2005
- FormFactor, Inc.
- Charles A. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for measuring signal path resistance for an integrated circu...
- Publication number 20050035774
- Publication date Feb 17, 2005
- FormFactor, Inc.
- John Long
- G01 - MEASURING TESTING
Information Patent Application
Closed-grid bus architecture for wafer interconnect structure
- Publication number 20050001638
- Publication date Jan 6, 2005
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
Closed-grid bus architecture for wafer interconnect structure
- Publication number 20030169061
- Publication date Sep 11, 2003
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
Method of designing, fabricating, testing and interconnecting an IC...
- Publication number 20030115568
- Publication date Jun 19, 2003
- FormFactor, Inc.
- Charles A. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of incorporating interconnect systems into an integrated cir...
- Publication number 20010000427
- Publication date Apr 26, 2001
- Charles A. Miller
- H01 - BASIC ELECTRIC ELEMENTS

John Matthew Long

Person

Patents Grantslast 30 patents

Doorbell system with pulse-driven boost rectifier

Doorbell system with pulse-driven boost rectifier

Closed-grid bus architecture for wafer interconnect structure

System for measuring signal path resistance for an integrated circu...

Closed-grid bus architecture for wafer interconnect structure

System for measuring signal path resistance for an integrated circu...

Probe head arrays

Closed-grid bus architecture for wafer interconnect structure

Method of incorporating interconnect systems into an integrated cir...

System for measuring signal path resistance for an integrated circu...

Method of designing, fabricating, testing and interconnecting an IC...

Closed-grid bus architecture for wafer interconnect structure

System for measuring signal path resistance for an integrated circu...

Closed-grid bus architecture for wafer interconnect structure

Method of designing, fabricating, testing and interconnecting an IC...

System for testing real and simulated versions of an integrated cir...

Patents Applicationslast 30 patents

DOORBELL SYSTEM WITH ENERGY STORAGE DEVICE

DOORBELL SYSTEM WITH ENERGY STORAGE DEVICE

DOORBELL SYSTEM WITH PULSE-DRIVEN BOOST RECTIFIER

CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE

CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE

SYSTEM FOR MEASURING SIGNAL PATH RESISTANCE FOR AN INTEGRATED CIRCU...

CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE

System For Measuring Signal Path Resistance For An Integrated Circu...

Probe head arrays

Method of incorporating interconnect systems into an integrated cir...

System for measuring signal path resistance for an integrated circu...

Closed-grid bus architecture for wafer interconnect structure

Closed-grid bus architecture for wafer interconnect structure

Method of designing, fabricating, testing and interconnecting an IC...

Method of incorporating interconnect systems into an integrated cir...