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John McMurtry
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Menlo Park, CA, US
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last 30 patents
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Patent Grant
Method and apparatus for protecting surfaces of optical components
Patent number
7,138,640
Issue date
Nov 21, 2006
KLA-Tencor Technologies, Corporation
Gil Delgado
G01 - MEASURING TESTING
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Patent Grant
Electron beam inspection system and method
Patent number
5,578,821
Issue date
Nov 26, 1996
KLA Instruments Corporation
Dan Meisberger
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Electron beam inspection system and method
Patent number
5,502,306
Issue date
Mar 26, 1996
KLA Instruments Corporation
Dan Meisburger
G01 - MEASURING TESTING