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John Memishian
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Newton, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Activity detection in MEMS accelerometers
Patent number
9,008,995
Issue date
Apr 14, 2015
Analog Devices, Inc.
James M. Lee
G01 - MEASURING TESTING
Information
Patent Grant
Activity detection in MEMS accelerometers
Patent number
8,239,160
Issue date
Aug 7, 2012
Analog Devices, Inc.
James M. Lee
G11 - INFORMATION STORAGE
Information
Patent Grant
Multiple axis acceleration sensor
Patent number
7,412,887
Issue date
Aug 19, 2008
Analog Devices, Inc.
John Memishian
G01 - MEASURING TESTING
Information
Patent Grant
Feedback circuit for micromachined accelerometer
Patent number
6,761,069
Issue date
Jul 13, 2004
Analog Devices, Inc.
David C. Hollocher
G01 - MEASURING TESTING
Information
Patent Grant
Feedback circuit for micromachined accelerometer
Patent number
6,530,275
Issue date
Mar 11, 2003
Analog Devices, Inc.
David C. Hollocher
G01 - MEASURING TESTING
Information
Patent Grant
Reset switch for a micromachined device
Patent number
5,748,004
Issue date
May 5, 1998
Analog Devices, Inc.
Thomas W. Kelly
G01 - MEASURING TESTING
Information
Patent Grant
Offset trimming for a micromachined sensing device
Patent number
5,659,262
Issue date
Aug 19, 1997
Analog Devices, Inc.
John Memishian
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Activity Detection in MEMS Accelerometers
Publication number
20120279304
Publication date
Nov 8, 2012
Analog Devices, Inc.
James M. Lee
G01 - MEASURING TESTING
Information
Patent Application
Activity Detection in MEMS Accelerometers
Publication number
20090240463
Publication date
Sep 24, 2009
Analog Devices, Inc.
James M. Lee
G01 - MEASURING TESTING
Information
Patent Application
Multiple axis acceleration sensor
Publication number
20060037397
Publication date
Feb 23, 2006
John Memishian
G01 - MEASURING TESTING
Information
Patent Application
Feedback circuit for micromachined accelerometer
Publication number
20030167843
Publication date
Sep 11, 2003
Analog Devices
David C. Hollocher
G01 - MEASURING TESTING