John Michael CARULLI

Person

Richardson, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Real time semiconductor process excursion monitor
- Patent number 10,101,386
- Issue date Oct 16, 2018
- Kenneth Michael Butler
- G01 - MEASURING TESTING
Information Patent Grant
Circuit aging sensor
- Patent number 9,714,966
- Issue date Jul 25, 2017
- Texas Instruments Incorporated
- Min Chen
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with automatic total ionizing dose (TID) exposur...
- Patent number 9,275,747
- Issue date Mar 1, 2016
- Texas Instruments Incorporated
- Robert Christopher Baumann
- G11 - INFORMATION STORAGE
Information Patent Grant
Reliability determination taking into account effect of component f...
- Patent number 8,689,168
- Issue date Apr 1, 2014
- Texas Instruments Incorporated
- Robert Christopher Baumann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor outlier identification using serially-combined data t...
- Patent number 8,126,681
- Issue date Feb 28, 2012
- Texas Instruments Incorporated
- Amit V Nahar
- G01 - MEASURING TESTING
Information Patent Grant
Identification of outlier semiconductor devices using data-driven s...
- Patent number 7,494,829
- Issue date Feb 24, 2009
- Texas Instruments Incorporated
- Suresh Subramaniam
- G01 - MEASURING TESTING
Information Patent Grant
Method for test data-driven statistical detection of outlier semico...
- Patent number 7,129,735
- Issue date Oct 31, 2006
- Texas Instruments Incorporated
- Suresh Subramaniam
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Real Time Semiconductor Process Excursion Monitor
- Publication number 20150234000
- Publication date Aug 20, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Kenneth Michael Butler
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT AGING SENSOR
- Publication number 20140097856
- Publication date Apr 10, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Min Chen
- G01 - MEASURING TESTING
Information Patent Application
RELIABILITY DETERMINATION TAKING INTO ACCOUNT EFFECT OF COMPONENT F...
- Publication number 20140096093
- Publication date Apr 3, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Robert Christopher BAUMANN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT WITH AUTOMATIC TOTAL IONIZING DOSE (TID) EXPOSUR...
- Publication number 20130334897
- Publication date Dec 19, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Robert Christopher Baumann
- G11 - INFORMATION STORAGE
Information Patent Application
Identification of Outlier Semiconductor Devices Using Data-Driven S...
- Publication number 20080262793
- Publication date Oct 23, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Suresh SUBRAMANIAM
- G01 - MEASURING TESTING
Information Patent Application
Method for estimating the early failure rate of semiconductor devices
- Publication number 20060107094
- Publication date May 18, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Thomas J. Anderson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for test data-driven statistical detection of outlier semico...
- Publication number 20060028229
- Publication date Feb 9, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Suresh Subramaniam
- G01 - MEASURING TESTING

John Michael CARULLI

Person

Patents Grantslast 30 patents

Real time semiconductor process excursion monitor

Circuit aging sensor

Integrated circuit with automatic total ionizing dose (TID) exposur...

Reliability determination taking into account effect of component f...

Semiconductor outlier identification using serially-combined data t...

Identification of outlier semiconductor devices using data-driven s...

Method for test data-driven statistical detection of outlier semico...

Patents Applicationslast 30 patents

Real Time Semiconductor Process Excursion Monitor

CIRCUIT AGING SENSOR

RELIABILITY DETERMINATION TAKING INTO ACCOUNT EFFECT OF COMPONENT F...

INTEGRATED CIRCUIT WITH AUTOMATIC TOTAL IONIZING DOSE (TID) EXPOSUR...

Identification of Outlier Semiconductor Devices Using Data-Driven S...

Method for estimating the early failure rate of semiconductor devices

Method for test data-driven statistical detection of outlier semico...