John Mitchels

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Brno, CZ

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Patents Grantslast 30 patents

Information Patent Grant
Systems and apparatuses for contamination-free vacuum transfer of s...
- Patent number 12,020,895
- Issue date Jun 25, 2024
- FEI Company
- Jakub Kuba
- G01 - MEASURING TESTING
Information Patent Grant
Charged-particle microscope with in situ deposition functionality
- Patent number 10,475,629
- Issue date Nov 12, 2019
- FEI Company
- John Mitchels
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Cryogenic specimen processing in a charged particle microscope
- Patent number 10,170,275
- Issue date Jan 1, 2019
- FEI Company
- John Mitchels
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF SAMPLE PREPARATON AND ANALYSIS
- Publication number 20240162001
- Publication date May 16, 2024
- FEI Company
- Michal Valík
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND APPARATUSES FOR CONTAMINATION-FREE VACUUM TRANSFER OF S...
- Publication number 20230253176
- Publication date Aug 10, 2023
- FEI Company
- Jakub Kuba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYOGENIC SPECIMEN PROCESSING IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20180114671
- Publication date Apr 26, 2018
- FEI Company
- John Mitchels
- G01 - MEASURING TESTING
Information Patent Application
CHARGED-PARTICLE MICROSCOPE WITH IN SITU DEPOSITION FUNCTIONALITY
- Publication number 20170345627
- Publication date Nov 30, 2017
- FEI Company
- John Mitchels
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...