John P. Keane

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods for operating system identification and web application exe...
- Patent number 8,776,096
- Issue date Jul 8, 2014
- International Business Machines Corporation
- Michael A. Bockus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test circuit for bias temperature instability recovery measurements
- Patent number 8,676,516
- Issue date Mar 18, 2014
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit for bias temperature instability recovery measurements
- Patent number 8,229,683
- Issue date Jul 24, 2012
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Grant
Webpage magnifier/formatter using CSS properties and cursor/mouse l...
- Patent number 8,132,109
- Issue date Mar 6, 2012
- International Business Machines Corporation
- Michael Andrew Bockus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Delay-based bias temperature instability recovery measurements for...
- Patent number 7,949,482
- Issue date May 24, 2011
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Grant
Method for QCRIT measurement in bulk CMOS using a switched capacito...
- Patent number 7,881,135
- Issue date Feb 1, 2011
- International Business Machines Corporation
- Ethan H. Cannon
- G01 - MEASURING TESTING
Information Patent Grant
Correction of delay-based metric measurements using delay circuits...
- Patent number 7,548,823
- Issue date Jun 16, 2009
- International Business Machines Corporation
- Harmander Singh
- G01 - MEASURING TESTING
Information Patent Grant
Calibration of multi-metric sensitive delay measurement circuits
- Patent number 7,542,862
- Issue date Jun 2, 2009
- International Business Machines Corporation
- Harmander Singh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST CIRCUIT FOR BIAS TEMPERATURE INSTABILITY RECOVERY MEASUREMENTS
- Publication number 20120262187
- Publication date Oct 18, 2012
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR OPERATING SYSTEM IDENTIFICATION AND WEB APPLICATION EXE...
- Publication number 20120216218
- Publication date Aug 23, 2012
- International Business Machines Corporation
- Michael A. Bockus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST CIRCUIT FOR BIAS TEMPERATURE INSTABILITY RECOVERY MEASUREMENTS
- Publication number 20110074394
- Publication date Mar 31, 2011
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Operating System Identification and Web App...
- Publication number 20100319010
- Publication date Dec 16, 2010
- International Business Machines Corporation
- Michael A. Bockus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WEBPAGE MAGNIFIER/FORMATTER USING CSS PROPERTIES AND CURSOR/MOUSE L...
- Publication number 20100293510
- Publication date Nov 18, 2010
- International Business Machines Corporation
- Michael Andrew Bockus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Qcrit Measurement in Bulk CMOS Using a Switched Capacito...
- Publication number 20100271057
- Publication date Oct 28, 2010
- Ethan H. Cannon
- G01 - MEASURING TESTING
Information Patent Application
Delay-Based Bias Temperature Instability Recovery Measurements for...
- Publication number 20090319202
- Publication date Dec 24, 2009
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION OF MULTI-METRIC SENSITIVE DELAY MEASUREMENT CIRCUITS
- Publication number 20090144006
- Publication date Jun 4, 2009
- Harmander Singh
- G01 - MEASURING TESTING
Information Patent Application
Calibration of Multi-Metric Sensitive Delay Measurement Circuits
- Publication number 20080288197
- Publication date Nov 20, 2008
- Harmander Singh
- G01 - MEASURING TESTING
Information Patent Application
Correction of Delay-Based Metric Measurements Using Delay Circuits...
- Publication number 20080288196
- Publication date Nov 20, 2008
- Harmander Singh
- G01 - MEASURING TESTING

John P. Keane

Person

Patents Grantslast 30 patents

Methods for operating system identification and web application exe...

Test circuit for bias temperature instability recovery measurements

Test circuit for bias temperature instability recovery measurements

Webpage magnifier/formatter using CSS properties and cursor/mouse l...

Delay-based bias temperature instability recovery measurements for...

Method for QCRIT measurement in bulk CMOS using a switched capacito...

Correction of delay-based metric measurements using delay circuits...

Calibration of multi-metric sensitive delay measurement circuits

Patents Applicationslast 30 patents

TEST CIRCUIT FOR BIAS TEMPERATURE INSTABILITY RECOVERY MEASUREMENTS

METHODS FOR OPERATING SYSTEM IDENTIFICATION AND WEB APPLICATION EXE...

TEST CIRCUIT FOR BIAS TEMPERATURE INSTABILITY RECOVERY MEASUREMENTS

Systems and Methods for Operating System Identification and Web App...

WEBPAGE MAGNIFIER/FORMATTER USING CSS PROPERTIES AND CURSOR/MOUSE L...

Method for Qcrit Measurement in Bulk CMOS Using a Switched Capacito...

Delay-Based Bias Temperature Instability Recovery Measurements for...

CALIBRATION OF MULTI-METRIC SENSITIVE DELAY MEASUREMENT CIRCUITS

Calibration of Multi-Metric Sensitive Delay Measurement Circuits

Correction of Delay-Based Metric Measurements Using Delay Circuits...