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John P. Lindley
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Redwood City, CA, US
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last 30 patents
Information
Patent Grant
Radiation discrimination system
Patent number
4,147,424
Issue date
Apr 3, 1979
Itek Corporation
L. Curtis Foster
G01 - MEASURING TESTING
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Patent Grant
Electro-optic system with expanded power range
Patent number
3,962,577
Issue date
Jun 8, 1976
Itek Corporation
John P. Lindley
G01 - MEASURING TESTING
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Patent Grant
Sweeping spectrum analyzer
Patent number
3,942,109
Issue date
Mar 2, 1976
Itek Corporation
Charles B. Crumly
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optic system with expanded power range
Patent number
3,934,153
Issue date
Jan 20, 1976
Itek Corporation
John P. Lindley
G02 - OPTICS