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John P. Long
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Garland, TX, US
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last 30 patents
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Patent Grant
Reduced stress electrode for focal plane array of thermal imaging s...
Patent number
5,847,390
Issue date
Dec 8, 1998
Texas Instruments Incorporated
John P. Long
G01 - MEASURING TESTING
Information
Patent Grant
Reduced stress focal plane array for thermal imaging system and method
Patent number
5,757,000
Issue date
May 26, 1998
Texas Instruments Incorporated
Donald A. Rogowski
G01 - MEASURING TESTING
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Patent Grant
Multiple level mask for patterning of ceramic materials
Patent number
5,587,090
Issue date
Dec 24, 1996
Texas Instruments Incorporated
James F. Belcher
C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information
Patent Grant
Thermal isolation for hybrid thermal detectors
Patent number
5,578,826
Issue date
Nov 26, 1996
Texas Instruments Incorporated
William K. Walker
G01 - MEASURING TESTING
Information
Patent Grant
Thermal isolation for hybrid thermal detectors
Patent number
5,574,282
Issue date
Nov 12, 1996
Texas Instruments Incorporated
William K. Walker
G01 - MEASURING TESTING
Information
Patent Grant
Thermal isolation for hybrid thermal detectors
Patent number
5,572,029
Issue date
Nov 5, 1996
William K. Walker
G01 - MEASURING TESTING
Information
Patent Grant
Thermal isolation structure for hybrid thermal detectors
Patent number
5,426,303
Issue date
Jun 20, 1995
Texas Instruments Incorporated
Robert A. Owen
H01 - BASIC ELECTRIC ELEMENTS