John Pane

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Tigard, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Synchronizing data from different clock domains by bridges one of t...
- Patent number 9,195,261
- Issue date Nov 24, 2015
- Teradyne, Inc.
- Corbin L. Champion
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for device testing using multiple processing p...
- Patent number 9,134,377
- Issue date Sep 15, 2015
- Teradyne, Inc.
- Corbin Champion
- G01 - MEASURING TESTING
Information Patent Grant
Jitter measurement algorithm using locally in-order strobes
- Patent number 7,668,235
- Issue date Feb 23, 2010
- Teradyne
- Michael Panis
- G01 - MEASURING TESTING
Information Patent Grant
Quantized data-dependent jitter injection using discrete samples
- Patent number 7,536,621
- Issue date May 19, 2009
- Teradyne, Inc.
- John R. Pane
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing non-deterministic device data
- Patent number 7,509,226
- Issue date Mar 24, 2009
- Teradyne, Inc.
- Jonathan M. Hops
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for testing non-deterministic device data
- Patent number 6,990,423
- Issue date Jan 24, 2006
- Teradyne, Inc.
- Benjamin Brown
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
ATE timing measurement unit and method
- Patent number 6,609,077
- Issue date Aug 19, 2003
- Teradyne, Inc.
- Benjamin Brown
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYNCHRONIZING DATA FROM DIFFERENT CLOCK DOMAINS
- Publication number 20150067382
- Publication date Mar 5, 2015
- Teradyne, Inc.
- Corbin L. Champion
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DEVICE TESTING USING MULTIPLE PROCESSING P...
- Publication number 20140281776
- Publication date Sep 18, 2014
- Teradyne, Inc.
- Corbin L. Champion
- G01 - MEASURING TESTING
Information Patent Application
QUANTIZED DATA-DEPENDENT JITTER INJECTION USING DISCRETE SAMPLES
- Publication number 20080141090
- Publication date Jun 12, 2008
- John R. Pane
- G01 - MEASURING TESTING
Information Patent Application
Jitter measurement algorithm using locally in-order strobes
- Publication number 20070118315
- Publication date May 24, 2007
- Teradyne, Inc.
- Michael Panis
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for testing non-deterministic device data
- Publication number 20060116840
- Publication date Jun 1, 2006
- Jonathan M. Hops
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Apparatus and method for testing non-deterministic device data
- Publication number 20040267487
- Publication date Dec 30, 2004
- Benjamin Brown
- H04 - ELECTRIC COMMUNICATION TECHNIQUE