John Q. Walker

Person

Colorado Springs, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
On chip local MOSFET sizing
- Patent number 7,895,550
- Issue date Feb 22, 2011
- LSI Corporation
- John Q. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methodology to measure many more transistors on the same test area
- Patent number 7,190,185
- Issue date Mar 13, 2007
- LSI Logic Corporation
- Franklin Duan
- G01 - MEASURING TESTING
Information Patent Grant
Reliability circuit for applying an AC stress signal or DC measurem...
- Patent number 7,183,791
- Issue date Feb 27, 2007
- LSI Logic Corporation
- John D. Walker
- G01 - MEASURING TESTING
Information Patent Grant
CMOS varactor with constant dC/dV characteristic
- Patent number 6,825,546
- Issue date Nov 30, 2004
- LSI Logic Corporation
- John Q. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analog capacitor in dual damascene process
- Patent number 6,822,282
- Issue date Nov 23, 2004
- LSI Logic Corporation
- Todd A. Randazzo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low voltage breakdown element for ESD trigger device
- Patent number 6,710,990
- Issue date Mar 23, 2004
- LSI Logic Corporation
- John de Q. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming analog capacitor dual damascene process
- Patent number 6,596,579
- Issue date Jul 22, 2003
- LSI Logic Corporation
- Todd A. Randazzo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic discharge protection system for mixed voltage applicatio...
- Patent number 6,515,839
- Issue date Feb 4, 2003
- Hoang P. Nguyen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interconnect-integrated metal-insulator-metal capacitor and method...
- Patent number 6,342,734
- Issue date Jan 29, 2002
- LSI Logic Corporation
- Derryl D. J. Allman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simple bicmos process for creation of low trigger voltage SCR and z...
- Patent number 6,130,117
- Issue date Oct 10, 2000
- LSI Logic Corporation
- John D. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating a low trigger voltage silicon controlled rec...
- Patent number 5,966,599
- Issue date Oct 12, 1999
- LSI Logic Corporation
- John D. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field implant for silicon controlled rectifier
- Patent number 5,894,153
- Issue date Apr 13, 1999
- AT&T Global Information Solutions Company
- John D. Walker
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Simple BICMOS process for creation of low trigger voltage SCR and z...
- Patent number 5,821,572
- Issue date Oct 13, 1998
- Symbios, Inc.
- John D. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge protection system for mixed voltage applica...
- Patent number 5,616,943
- Issue date Apr 1, 1997
- AT&T Global Information Solutions Company
- Hoang P. Nguyen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lightly doped drain ballast resistor
- Patent number 5,498,892
- Issue date Mar 12, 1996
- NCR Corporation
- John D. Walker
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
On Chip Local MOSFET Sizing
- Publication number 20090265675
- Publication date Oct 22, 2009
- LSI Corporation
- John Q. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reliability circuit for applying an AC stress signal or DC measurem...
- Publication number 20060076972
- Publication date Apr 13, 2006
- LSI Logic Corporation
- John D. Walker
- G01 - MEASURING TESTING
Information Patent Application
New methodology to measure many more transistors on the same test area
- Publication number 20050093560
- Publication date May 5, 2005
- Franklin Duan
- G01 - MEASURING TESTING
Information Patent Application
Low voltage breakdown element for ESD trigger device
- Publication number 20040104436
- Publication date Jun 3, 2004
- John de Q. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Negative bias temperature instability effect modeling
- Publication number 20040073412
- Publication date Apr 15, 2004
- John de Quincey Walker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analog capacitor in dual damascene process
- Publication number 20030176035
- Publication date Sep 18, 2003
- LSI Logic Corporation
- Todd A. Randazzo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Low voltage breakdown element for ESD trigger device
- Publication number 20030137789
- Publication date Jul 24, 2003
- John de Q. Walker
- H01 - BASIC ELECTRIC ELEMENTS

John Q. Walker

Person

Patents Grantslast 30 patents

On chip local MOSFET sizing

Methodology to measure many more transistors on the same test area

Reliability circuit for applying an AC stress signal or DC measurem...

CMOS varactor with constant dC/dV characteristic

Analog capacitor in dual damascene process

Low voltage breakdown element for ESD trigger device

Method of forming analog capacitor dual damascene process

Electronic discharge protection system for mixed voltage applicatio...

Interconnect-integrated metal-insulator-metal capacitor and method...

Simple bicmos process for creation of low trigger voltage SCR and z...

Method for fabricating a low trigger voltage silicon controlled rec...

Field implant for silicon controlled rectifier

Simple BICMOS process for creation of low trigger voltage SCR and z...

Electrostatic discharge protection system for mixed voltage applica...

Lightly doped drain ballast resistor

Patents Applicationslast 30 patents

On Chip Local MOSFET Sizing

Reliability circuit for applying an AC stress signal or DC measurem...

New methodology to measure many more transistors on the same test area

Low voltage breakdown element for ESD trigger device

Negative bias temperature instability effect modeling

Analog capacitor in dual damascene process

Low voltage breakdown element for ESD trigger device