John R. Doughty

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Poughkeepsie, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer slip detection during CMP processing
- Patent number 9,240,042
- Issue date Jan 19, 2016
- GLOBALFOUNDRIES Inc.
- John R. Doughty
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
WAFER SLIP DETECTION DURING CMP PROCESSING
- Publication number 20160082566
- Publication date Mar 24, 2016
- GLOBALFOUNDRIES INC.
- John R. Doughty
- G01 - MEASURING TESTING
Information Patent Application
WAFER SLIP DETECTION DURING CMP PROCESSING
- Publication number 20150117755
- Publication date Apr 30, 2015
- International Business Machines Corporation
- John R. Doughty
- G06 - COMPUTING CALCULATING COUNTING