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John R. Gilbertson II
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Pittsburgh, PA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method for maintaining high-quality focus during high-throughput, m...
Patent number
6,816,606
Issue date
Nov 9, 2004
InterScope Technologies, Inc.
Arthur W. Wetzel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System for microscopic digital montage imaging using a pulse light...
Patent number
6,798,571
Issue date
Sep 28, 2004
InterScope Technologies, Inc.
Arthur W. Wetzel
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
System and method for finding regions of interest for microscopic d...
Publication number
20080123919
Publication date
May 29, 2008
Arthur W. Wetzel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System for creating microscopic digital montage images
Publication number
20060204072
Publication date
Sep 14, 2006
Arthur W. Wetzel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System and method for finding regions of interest for microscopic d...
Publication number
20060045320
Publication date
Mar 2, 2006
Trestle Corporation
Arthur W. Wetzel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System and method for finding regions of interest for microscopic d...
Publication number
20060029266
Publication date
Feb 9, 2006
Trestle Corporation
Arthur W. Wetzel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for maintaining High-quality focus during high-throughput, m...
Publication number
20020114497
Publication date
Aug 22, 2002
Arthur W. Wetzel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System and method for finding regions of interest for microscopic d...
Publication number
20020090120
Publication date
Jul 11, 2002
Arthur W. Wetzel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System for microscopic digital montage imaging using a pulse light...
Publication number
20020089740
Publication date
Jul 11, 2002
Arthur W. Wetzel
G01 - MEASURING TESTING