John R. Goss

Person

Saint Albans, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Reliable electronic fuse based storage using error correction coding
- Patent number 12,266,415
- Issue date Apr 1, 2025
- MARVELL ASIA PTE. LTD.
- Kevin William Gorman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Customer-transparent logic redundancy for improved yield
- Patent number 11,293,980
- Issue date Apr 5, 2022
- International Business Machines Corporation
- Igor Arsovski
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test (BIST) engine configured to store a per pattern...
- Patent number 11,295,829
- Issue date Apr 5, 2022
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test (BIST) engine configured to store a per pattern...
- Patent number 10,971,243
- Issue date Apr 6, 2021
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Customer-transparent logic redundancy for improved yield
- Patent number 10,955,474
- Issue date Mar 23, 2021
- International Business Machines Corporation
- Igor Arsovski
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test (BIST) engine configured to store a per pattern...
- Patent number 10,692,584
- Issue date Jun 23, 2020
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Customer-transparent logic redundancy for improved yield
- Patent number 10,551,436
- Issue date Feb 4, 2020
- International Business Machines Corporation
- Igor Arsovski
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test (BIST) engine configured to store a per pattern...
- Patent number 10,553,302
- Issue date Feb 4, 2020
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit design verification in a hardware accelerated simulation en...
- Patent number 10,539,614
- Issue date Jan 21, 2020
- International Business Machines Corporation
- Rahul Batra
- G01 - MEASURING TESTING
Information Patent Grant
Circuit design verification in a hardware accelerated simulation en...
- Patent number 9,939,487
- Issue date Apr 10, 2018
- International Business Machines Corporation
- Rahul Batra
- G01 - MEASURING TESTING
Information Patent Grant
Built-in-self-test (BIST) engine configured to store a per pattern...
- Patent number 9,881,694
- Issue date Jan 30, 2018
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Customer-transparent logic redundancy for improved yield
- Patent number 9,791,507
- Issue date Oct 17, 2017
- International Business Machines Corporation
- Igor Arsovski
- G01 - MEASURING TESTING
Information Patent Grant
Application specific integrated circuit (ASIC) test screens and sel...
- Patent number 9,760,673
- Issue date Sep 12, 2017
- GLOBALFOUNDRIES Inc.
- Eric D. Hunt-Schroeder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Threshold voltage (VT)-type transistor sensitive and/or fan-out sen...
- Patent number 9,653,330
- Issue date May 16, 2017
- GLOBALFOUNDRIES Inc.
- Jeanne P. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Customer-transparent logic redundancy for improved yield
- Patent number 9,274,171
- Issue date Mar 1, 2016
- International Business Machines Corporation
- Igor Arsovski
- G01 - MEASURING TESTING
Information Patent Grant
Thermally adaptive in-system allocation
- Patent number 8,963,566
- Issue date Feb 24, 2015
- Intenational Business Machines Corporation
- John R. Goss
- G01 - MEASURING TESTING
Information Patent Grant
Reliability evaluation and system fail warning methods using on chi...
- Patent number 8,949,767
- Issue date Feb 3, 2015
- Mentor Graphics Corporation
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Grant
Selectable repair pass masking
- Patent number 8,570,820
- Issue date Oct 29, 2013
- International Business Machines Corporation
- Kevin William Gorman
- G11 - INFORMATION STORAGE
Information Patent Grant
Reliability evaluation and system fail warning methods using on chi...
- Patent number 8,504,975
- Issue date Aug 6, 2013
- Mentor Graphics Corporation
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Grant
Reliability evaluation and system fail warning methods using on chi...
- Patent number 8,095,907
- Issue date Jan 10, 2012
- International Business Machines Corporation
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic method and apparatus for non-destructively observing lat...
- Patent number 7,916,826
- Issue date Mar 29, 2011
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Grant
Regulating electrical fuse programming current
- Patent number 7,911,820
- Issue date Mar 22, 2011
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for controlling access to addressable integrated...
- Patent number 7,904,839
- Issue date Mar 8, 2011
- International Business Machines Corporation
- John R. Goss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Structure for a system for controlling access to addressable integr...
- Patent number 7,831,936
- Issue date Nov 9, 2010
- International Business Machines Corporation
- John R. Goss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing method using a scalable parametric measurement macro
- Patent number 7,656,182
- Issue date Feb 2, 2010
- International Business Machines Corporation
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Grant
Method of acceptance for semiconductor devices
- Patent number 7,560,946
- Issue date Jul 14, 2009
- International Business Machines Corporation
- Jeanne Paulette Spence Bickford
- G01 - MEASURING TESTING
Information Patent Grant
Parametric-based semiconductor design
- Patent number 7,487,477
- Issue date Feb 3, 2009
- International Business Machines Corporation
- Jeanne Paulette Spence Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diagnostic method and apparatus for non-destructively observing lat...
- Patent number 7,453,973
- Issue date Nov 18, 2008
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Grant
Diagnostic method and apparatus for non-destructively observing lat...
- Patent number 7,145,977
- Issue date Dec 5, 2006
- International Business Machines Corporation
- Darren L Anand
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
CUSTOMER-TRANSPARENT LOGIC REDUNDANCY FOR IMPROVED YIELD
- Publication number 20210116498
- Publication date Apr 22, 2021
- International Business Machines Corporation
- Igor ARSOVSKI
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...
- Publication number 20200075119
- Publication date Mar 5, 2020
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
CUSTOMER-TRANSPARENT LOGIC REDUNDANCY FOR IMPROVED YIELD
- Publication number 20200072902
- Publication date Mar 5, 2020
- International Business Machines Corporation
- Igor ARSOVSKI
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...
- Publication number 20190378587
- Publication date Dec 12, 2019
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCUIT DESIGN VERIFICATION IN A HARDWARE ACCELERATED SIMULATION EN...
- Publication number 20180059182
- Publication date Mar 1, 2018
- International Business Machines Corporation
- Rahul BATRA
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...
- Publication number 20180061509
- Publication date Mar 1, 2018
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...
- Publication number 20180053566
- Publication date Feb 22, 2018
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
CUSTOMER-TRANSPARENT LOGIC REDUNDANCY FOR IMPROVED YIELD
- Publication number 20170370990
- Publication date Dec 28, 2017
- International Business Machines Corporation
- Igor ARSOVSKI
- G01 - MEASURING TESTING
Information Patent Application
Application specific integrated circuit (ASIC) test screens and sel...
- Publication number 20170220727
- Publication date Aug 3, 2017
- GLOBALFOUNDRIES INC.
- Eric D. Hunt-Schroeder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT DESIGN VERIFICATION IN A HARDWARE ACCELERATED SIMULATION EN...
- Publication number 20170176529
- Publication date Jun 22, 2017
- International Business Machines Corporation
- Rahul BATRA
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN SELF-TEST (BIST) ENGINE
- Publication number 20170018313
- Publication date Jan 19, 2017
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
CUSTOMER-TRANSPARENT LOGIC REDUNDANCY FOR IMPROVED YIELD
- Publication number 20160131706
- Publication date May 12, 2016
- International Business Machines Corporation
- Igor ARSOVSKI
- G01 - MEASURING TESTING
Information Patent Application
THERMALLY ADAPTIVE IN-SYSTEM ALLOCATION
- Publication number 20140097860
- Publication date Apr 10, 2014
- International Business Machines Corporation
- John R. Goss
- G01 - MEASURING TESTING
Information Patent Application
RELIABILITY EVALUATION AND SYSTEM FAIL WARNING METHODS USING ON CHI...
- Publication number 20130326442
- Publication date Dec 5, 2013
- Mentor Graphics Corporation
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Application
SELECTABLE REPAIR PASS MASKING
- Publication number 20120230136
- Publication date Sep 13, 2012
- International Business Machines Corporation
- Kevin William Gorman
- G11 - INFORMATION STORAGE
Information Patent Application
RELIABILITY EVALUATION AND SYSTEM FAIL WARNING METHODS USING ON CHI...
- Publication number 20120105240
- Publication date May 3, 2012
- International Business Machines Corporation
- Jeanne P. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REGULATING ELECTRICAL FUSE PROGRAMMING CURRENT
- Publication number 20100014373
- Publication date Jan 21, 2010
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Application
DIAGNOSTIC METHOD AND APPARATUS FOR NON-DESTRUCTIVELY OBSERVING LAT...
- Publication number 20090180584
- Publication date Jul 16, 2009
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Application
Design Structure for a System For Controlling Access to Addressable...
- Publication number 20090164961
- Publication date Jun 25, 2009
- International Business Machines Corporation
- John R. Goss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Controlling Access to Addressable Integrated...
- Publication number 20090158444
- Publication date Jun 18, 2009
- John R. Goss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RELIABILITY EVALUATION AND SYSTEM FAIL WARNING METHODS USING ON CHI...
- Publication number 20090106712
- Publication date Apr 23, 2009
- Jeanne P. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Acceptance for Semiconductor Devices
- Publication number 20090039912
- Publication date Feb 12, 2009
- International Business Machines Corporation
- Jeanne Paulette Spence Bickford
- G01 - MEASURING TESTING
Information Patent Application
TESTING METHOD USING A SCALABLE PARAMETRIC MEASUREMENT MACRO
- Publication number 20080231307
- Publication date Sep 25, 2008
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Application
PARAMETRIC-BASED SEMICONDUCTOR DESIGN
- Publication number 20080148197
- Publication date Jun 19, 2008
- International Business Machines Corporation
- Jeanne Paulette Spence Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Diagnostic Method and Apparatus For Non-Destructively Observing Lat...
- Publication number 20070033458
- Publication date Feb 8, 2007
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Application
DIAGNOSTIC METHOD AND APPARATUS FOR NON-DESTRUCTIVELY OBSERVING LAT...
- Publication number 20050025277
- Publication date Feb 3, 2005
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE

John R. Goss

Person

Patents Grantslast 30 patents

Reliable electronic fuse based storage using error correction coding

Customer-transparent logic redundancy for improved yield

Built-in self-test (BIST) engine configured to store a per pattern...

Built-in self-test (BIST) engine configured to store a per pattern...

Customer-transparent logic redundancy for improved yield

Built-in self-test (BIST) engine configured to store a per pattern...

Customer-transparent logic redundancy for improved yield

Built-in self-test (BIST) engine configured to store a per pattern...

Circuit design verification in a hardware accelerated simulation en...

Circuit design verification in a hardware accelerated simulation en...

Built-in-self-test (BIST) engine configured to store a per pattern...

Customer-transparent logic redundancy for improved yield

Application specific integrated circuit (ASIC) test screens and sel...

Threshold voltage (VT)-type transistor sensitive and/or fan-out sen...

Customer-transparent logic redundancy for improved yield

Thermally adaptive in-system allocation

Reliability evaluation and system fail warning methods using on chi...

Selectable repair pass masking

Reliability evaluation and system fail warning methods using on chi...

Reliability evaluation and system fail warning methods using on chi...

Diagnostic method and apparatus for non-destructively observing lat...

Regulating electrical fuse programming current

System and method for controlling access to addressable integrated...

Structure for a system for controlling access to addressable integr...

Testing method using a scalable parametric measurement macro

Method of acceptance for semiconductor devices

Parametric-based semiconductor design

Diagnostic method and apparatus for non-destructively observing lat...

Diagnostic method and apparatus for non-destructively observing lat...

Patents Applicationslast 30 patents

CUSTOMER-TRANSPARENT LOGIC REDUNDANCY FOR IMPROVED YIELD

BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...

CUSTOMER-TRANSPARENT LOGIC REDUNDANCY FOR IMPROVED YIELD

BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...

CIRCUIT DESIGN VERIFICATION IN A HARDWARE ACCELERATED SIMULATION EN...

BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...

BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...

CUSTOMER-TRANSPARENT LOGIC REDUNDANCY FOR IMPROVED YIELD

Application specific integrated circuit (ASIC) test screens and sel...

CIRCUIT DESIGN VERIFICATION IN A HARDWARE ACCELERATED SIMULATION EN...

BUILT-IN SELF-TEST (BIST) ENGINE

CUSTOMER-TRANSPARENT LOGIC REDUNDANCY FOR IMPROVED YIELD

THERMALLY ADAPTIVE IN-SYSTEM ALLOCATION

RELIABILITY EVALUATION AND SYSTEM FAIL WARNING METHODS USING ON CHI...

SELECTABLE REPAIR PASS MASKING

RELIABILITY EVALUATION AND SYSTEM FAIL WARNING METHODS USING ON CHI...

REGULATING ELECTRICAL FUSE PROGRAMMING CURRENT

DIAGNOSTIC METHOD AND APPARATUS FOR NON-DESTRUCTIVELY OBSERVING LAT...

Design Structure for a System For Controlling Access to Addressable...

System and Method for Controlling Access to Addressable Integrated...

RELIABILITY EVALUATION AND SYSTEM FAIL WARNING METHODS USING ON CHI...

Method of Acceptance for Semiconductor Devices

TESTING METHOD USING A SCALABLE PARAMETRIC MEASUREMENT MACRO

PARAMETRIC-BASED SEMICONDUCTOR DESIGN

Diagnostic Method and Apparatus For Non-Destructively Observing Lat...

DIAGNOSTIC METHOD AND APPARATUS FOR NON-DESTRUCTIVELY OBSERVING LAT...