John R. Hauser

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Raleigh, NC, US

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Patents Grantslast 30 patents

Information Patent Grant
MOSFET test structure for capacitance-voltage measurements
- Patent number 6,472,233
- Issue date Oct 29, 2002
- Advanced Micro Devices, Inc.
- Khaled Z. Ahmed
- G01 - MEASURING TESTING
Information Patent Grant
Three-zone rapid thermal processing system utilizing wafer edge hea...
- Patent number 5,418,885
- Issue date May 23, 1995
- North Carolina State University
- John R. Hauser
- C30 - CRYSTAL GROWTH
Information Patent Grant
Conical rapid thermal processing apparatus
- Patent number 5,253,324
- Issue date Oct 12, 1993
- North Carolina State University
- Jimmie J. Wortman
- C30 - CRYSTAL GROWTH
Information Patent Grant
High impendance-coupled CMOS SRAM for improved single event immunity
- Patent number 4,805,148
- Issue date Feb 14, 1989
- Sherra E. Diehl-Nagle
- G11 - INFORMATION STORAGE