John R. Jordan III

Person

Mountain View, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for region-adaptive defect detection
- Patent number 10,535,131
- Issue date Jan 14, 2020
- KLA-Tencor Corporation
- Christopher Maher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for defect classification
- Patent number 10,482,590
- Issue date Nov 19, 2019
- KLA-Tencor Corporation
- Li He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single image detection
- Patent number 10,186,026
- Issue date Jan 22, 2019
- KLA-Tencor Corp.
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for iterative defect classification
- Patent number 9,922,269
- Issue date Mar 20, 2018
- KLA-Tencor Corporation
- Sankar Venkataraman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for defect classification
- Patent number 9,898,811
- Issue date Feb 20, 2018
- KLA-Tencor Corporation
- Li He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Decision tree construction for automatic classification of defects...
- Patent number 9,489,599
- Issue date Nov 8, 2016
- KLA-Tencor Corp.
- Chien-Huei (Adam) Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting defects on a wafer
- Patent number 9,355,208
- Issue date May 31, 2016
- KLA-Tencor Corp.
- Eugene Shifrin
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection system
- Patent number 5,864,394
- Issue date Jan 26, 1999
- KLA-Tencor Corporation
- John R. Jordan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and System for Defect Classification
- Publication number 20180114310
- Publication date Apr 26, 2018
- KLA-Tencor Corporation
- Li He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Region-Adaptive Defect Detection
- Publication number 20170140516
- Publication date May 18, 2017
- KLA-Tencor Corporation
- Christopher Maher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SINGLE IMAGE DETECTION
- Publication number 20170140524
- Publication date May 18, 2017
- KLA-Tencor Corporation
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Iterative Defect Classification
- Publication number 20160358041
- Publication date Dec 8, 2016
- KLA-Tencor Corporation
- Sankar Venkataraman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Defect Classification
- Publication number 20160328837
- Publication date Nov 10, 2016
- KLA-Tencor Corporation
- Li He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Decision Tree Construction for Automatic Classification of Defects...
- Publication number 20150125064
- Publication date May 7, 2015
- KLA-Tencor Corporation
- Chien-Huei (Adam) Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Detecting Repeating Defects on Semiconducto...
- Publication number 20150012900
- Publication date Jan 8, 2015
- KLA-Tencor Corporation
- Eugene Shifrin
- G01 - MEASURING TESTING

John R. Jordan III

Person

Patents Grantslast 30 patents

Systems and methods for region-adaptive defect detection

Method and system for defect classification

Single image detection

Method and system for iterative defect classification

Method and system for defect classification

Decision tree construction for automatic classification of defects...

Detecting defects on a wafer

Surface inspection system

Patents Applicationslast 30 patents

Method and System for Defect Classification

Systems and Methods for Region-Adaptive Defect Detection

SINGLE IMAGE DETECTION

Method and System for Iterative Defect Classification

Method and System for Defect Classification

Decision Tree Construction for Automatic Classification of Defects...

Methods and Systems for Detecting Repeating Defects on Semiconducto...