John R. Long

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Essex Junction, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
In-line measurement of transistor device cut-off frequency
- Patent number 9,297,853
- Issue date Mar 29, 2016
- GLOBALFOUNDRIES Inc.
- John J. Benoit
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IN-LINE MEASUREMENT OF TRANSISTOR DEVICE CUT-OFF FREQUENCY
- Publication number 20140368227
- Publication date Dec 18, 2014
- John J. Benoit
- G01 - MEASURING TESTING