John R. Pivnichny

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Vestal, NY, US

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Patents Grantslast 30 patents

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Method for testing integrated circuit components of a multi-compone...
- Patent number 6,194,905
- Issue date Feb 27, 2001
- International Business Machines Corporation
- John R. Pivnichny
- G01 - MEASURING TESTING
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Apparatus and method for testing integrated circuit components of a...
- Patent number 6,107,812
- Issue date Aug 22, 2000
- International Business Machines Corporation
- John R. Pivnichny
- G01 - MEASURING TESTING
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- Patent number 5,974,445
- Issue date Oct 26, 1999
- International Business Machines Corporation
- John Robert Pivnichny
- G06 - COMPUTING CALCULATING COUNTING