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John R.M. Viertl
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Niskayuna, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system for assembling and nondestructive testing of asse...
Patent number
6,698,288
Issue date
Mar 2, 2004
General Electric Company
Shahram Shirzad
G01 - MEASURING TESTING
Information
Patent Grant
Eddy current probe with foil sensor mounted on flexible probe tip a...
Patent number
6,288,537
Issue date
Sep 11, 2001
General Electric Company
John R. M. Viertl
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic pulser/receiver for ultrasonic test equipment
Patent number
5,963,882
Issue date
Oct 5, 1999
General Electric Company
John R. M. Viertl
G01 - MEASURING TESTING
Information
Patent Grant
Rolling-ball thermoelectric potential probe and housing for nondest...
Patent number
5,544,953
Issue date
Aug 13, 1996
General Electric Co.
John R. M. Viertl
G01 - MEASURING TESTING
Information
Patent Grant
Combined thermoelectric and eddy-current method and apparatus for n...
Patent number
5,430,376
Issue date
Jul 4, 1995
General Electric Company
John R. M. Viertl
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Eddy current probe apparatus and interlaced scanning method for int...
Patent number
5,334,934
Issue date
Aug 2, 1994
General Electric Company
John R. M. Viertl
G01 - MEASURING TESTING
Information
Patent Grant
Carriage for eddy current probe having contact ball engagement betw...
Patent number
5,329,230
Issue date
Jul 12, 1994
General Electric Company
John R. M. Viertl
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for determining the thickness of a coating on...
Patent number
4,920,319
Issue date
Apr 24, 1990
General Electric Company
John R. M. Viertl
G01 - MEASURING TESTING
Information
Patent Grant
High frequency eddy current probe with planar, spiral-like coil on...
Patent number
4,706,020
Issue date
Nov 10, 1987
General Electric Company
John R. M. Viertl
G01 - MEASURING TESTING
Information
Patent Grant
Eddy current method for detecting a flaw in semi-conductive material
Patent number
4,593,245
Issue date
Jun 3, 1986
General Electric Company
John R. M. Viertl
G01 - MEASURING TESTING
Information
Patent Grant
Semi-nondestructive residual stress measurement
Patent number
4,249,423
Issue date
Feb 10, 1981
General Electric Company
John R. M. Viertl
G01 - MEASURING TESTING
Information
Patent Grant
Acoustic non-intrusive method for check of the set point of a sprin...
Patent number
4,086,809
Issue date
May 2, 1978
General Electric Company
Peter T. K. Wu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method and system for assembling and nondestructive testing of asse...
Publication number
20030106376
Publication date
Jun 12, 2003
Shahram Shirzad
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for exchanging information, such as nondestruct...
Publication number
20020130818
Publication date
Sep 19, 2002
John R.M. Viertl
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Pointer control system
Publication number
20020080172
Publication date
Jun 27, 2002
John R.M. Viertl
G06 - COMPUTING CALCULATING COUNTING