John Robert Brehm

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Middletown, OH, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system to inspect a component
- Patent number 7,065,176
- Issue date Jun 20, 2006
- General Electric Company
- Kevin Moermond
- G01 - MEASURING TESTING
Information Patent Grant
Multiple focal spot X-ray inspection system
- Patent number 6,895,079
- Issue date May 17, 2005
- General Electric Company
- Thomas William Birdwell
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection system
- Patent number 4,803,639
- Issue date Feb 7, 1989
- General Electric Company
- Douglas S. Steele
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM TO INSPECT A COMPONENT
- Publication number 20040240607
- Publication date Dec 2, 2004
- GENERAL ELECTRIC COMPANY
- Kevin Moermond
- G01 - MEASURING TESTING
Information Patent Application
Multiple focal spot X-ray inspection system
- Publication number 20040037393
- Publication date Feb 26, 2004
- General Electric Company
- Thomas William Birdwell
- G01 - MEASURING TESTING