John S. CORBIN, JR.

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Achieving mechanical and thermal stability in a multi-chip package
- Patent number 8,202,765
- Issue date Jun 19, 2012
- International Business Machines Corporation
- Jon A. Casey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Heatsink apparatus for applying a specified compressive force to an...
- Patent number 7,777,329
- Issue date Aug 17, 2010
- International Business Machines Corporation
- John L. Colbert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic assembly and techniques for installing a heatsink in an...
- Patent number 7,701,720
- Issue date Apr 20, 2010
- International Business Machines Corporation
- John L. Colbert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
IC chip package having automated tolerance compensation
- Patent number 7,687,894
- Issue date Mar 30, 2010
- International Business Machines Corporation
- John S. Corbin, Jr.
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,479,796
- Issue date Jan 20, 2009
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,466,155
- Issue date Dec 16, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,463,017
- Issue date Dec 9, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,456,644
- Issue date Nov 25, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,453,279
- Issue date Nov 18, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,425,822
- Issue date Sep 16, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,423,440
- Issue date Sep 9, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,405,583
- Issue date Jul 29, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,352,200
- Issue date Apr 1, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Non-influencing fastener for mounting a heat sink in contact with a...
- Patent number 7,345,881
- Issue date Mar 18, 2008
- International Business Machines Corporation
- John Lee Colbert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature and condensation control system for functional tester
- Patent number 7,135,877
- Issue date Nov 14, 2006
- International Business Machines Corporation
- Daniel Paul Beaman
- G01 - MEASURING TESTING
Information Patent Grant
Packaging for enhanced thermal and structural performance of electr...
- Patent number 7,119,433
- Issue date Oct 10, 2006
- International Business Machines Corporation
- John S. Corbin, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for providing positive contact force in an ele...
- Patent number 6,921,272
- Issue date Jul 26, 2005
- International Business Machines Corporation
- John S. Corbin, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for functional and stress testing of exposed chip land gr...
- Patent number 6,911,836
- Issue date Jun 28, 2005
- International Business Machines Corporation
- Lonnie J. Cannon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD OF ACHIEVING MECHANICAL AND THERMAL STABILITY IN...
- Publication number 20120175766
- Publication date Jul 12, 2012
- International Business Machines Corporation
- Jon A. CASEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method of Achieving Mechanical and Thermal Stability in...
- Publication number 20100181665
- Publication date Jul 22, 2010
- International Business Machines Corporation
- Jon A. CASEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electronic Assembly and Techniques for Installing a Heatsink in an...
- Publication number 20090083972
- Publication date Apr 2, 2009
- John L. Colbert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR ATTACHING HEATSINKS
- Publication number 20090034198
- Publication date Feb 5, 2009
- International Business Machines Corporation
- John L. Colbert
- H01 - BASIC ELECTRIC ELEMENTS

John S. CORBIN, JR.

Person

Patents Grantslast 30 patents

Achieving mechanical and thermal stability in a multi-chip package

Heatsink apparatus for applying a specified compressive force to an...

Electronic assembly and techniques for installing a heatsink in an...

IC chip package having automated tolerance compensation

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Non-influencing fastener for mounting a heat sink in contact with a...

Temperature and condensation control system for functional tester

Packaging for enhanced thermal and structural performance of electr...

Method and apparatus for providing positive contact force in an ele...

Apparatus for functional and stress testing of exposed chip land gr...

Patents Applicationslast 30 patents

SYSTEM AND METHOD OF ACHIEVING MECHANICAL AND THERMAL STABILITY IN...

System and Method of Achieving Mechanical and Thermal Stability in...

Electronic Assembly and Techniques for Installing a Heatsink in an...

APPARATUS AND METHOD FOR ATTACHING HEATSINKS