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John S. Ferrario
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Waterbury, VT, US
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Patents Grants
last 30 patents
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Patent Grant
Optical on-wafer probing with v-groove couplers
Patent number
10,914,897
Issue date
Feb 9, 2021
GLOBALFOUNDRIES Inc.
Hanyi Ding
G02 - OPTICS
Information
Patent Grant
High power radio frequency (RF) in-line wafer testing
Patent number
9,599,657
Issue date
Mar 21, 2017
GLOBALFOUNDRIES Inc.
Hanyi Ding
G01 - MEASURING TESTING
Information
Patent Grant
Through printed circuit board (PCB) vias
Patent number
9,408,304
Issue date
Aug 2, 2016
GLOBALFOUNDRIES Inc.
Dana H. Brown
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Patent Grant
High-frequency cobra probe
Patent number
8,994,393
Issue date
Mar 31, 2015
International Business Machines Corporation
Hanyi Ding
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for testing semiconductor laser devices
Patent number
5,498,973
Issue date
Mar 12, 1996
International Business Machines Corporation
William A. Cavaliere
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
OPTICAL ON-WAFER PROBING WITH V-GROOVE COUPLERS
Publication number
20200192033
Publication date
Jun 18, 2020
GLOBALFOUNDRIES INC.
Hanyi Ding
G01 - MEASURING TESTING
Information
Patent Application
THROUGH PRINTED CIRCUIT BOARD (PCB) VIAS
Publication number
20150208502
Publication date
Jul 23, 2015
International Business Machines Corporation
Dana H. BROWN
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
HIGH POWER RADIO FREQUENCY (RF) IN-LINE WAFER TESTING
Publication number
20140184258
Publication date
Jul 3, 2014
International Business Machines Corporation
Hanyi DING
G01 - MEASURING TESTING
Information
Patent Application
HIGH-FREQUENCY COBRA PROBE
Publication number
20140062519
Publication date
Mar 6, 2014
International Business Machines Corporation
Hanyi DING
G01 - MEASURING TESTING