John S. Starzynski

Person

Brooklyn Park, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Resonating beam accelerometer
- Patent number 9,784,758
- Issue date Oct 10, 2017
- Honeywell International Inc.
- John S. Starzynski
- G01 - MEASURING TESTING
Information Patent Grant
Methods for making a sensitive resonating beam accelerometer
- Patent number 9,009,947
- Issue date Apr 21, 2015
- Honeywell International Inc.
- John S. Starzynski
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for improving performance of an accelerometer
- Patent number 8,485,032
- Issue date Jul 16, 2013
- Honeywell International Inc.
- John S. Starzynski
- G01 - MEASURING TESTING
Information Patent Grant
Methods for making a sensitive resonating beam accelerometer
- Patent number 8,176,617
- Issue date May 15, 2012
- Honeywell International Inc.
- John S. Starzynski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
REDUCING HYSTERESIS EFFECTS IN AN ACCELEROMETER
- Publication number 20170010297
- Publication date Jan 12, 2017
- Honeywell International Inc.
- Paul W. Dwyer
- G01 - MEASURING TESTING
Information Patent Application
RESONATING BEAM ACCELEROMETER
- Publication number 20150268267
- Publication date Sep 24, 2015
- Honeywell International Inc.
- John S. Starzynski
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR IMPROVING PERFORMANCE OF AN ACCELEROMETER
- Publication number 20120234094
- Publication date Sep 20, 2012
- Honeywell International Inc.
- John S. Starzynski
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR MAKING A SENSITIVE RESONATING BEAM ACCELEROMETER
- Publication number 20120227495
- Publication date Sep 13, 2012
- Honeywell International Inc.
- John S. Starzynski
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR MAKING A SENSITIVE RESONATING BEAM ACCELEROMETER
- Publication number 20110239440
- Publication date Oct 6, 2011
- Honeywell International Inc.
- John S. Starzynski
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR ACCURATELY MEASURING THE THICKNESS OF AN EPITAXIAL LAYE...
- Publication number 20090203156
- Publication date Aug 13, 2009
- Honeywell International Inc.
- John S. Starzynski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ISOTROPIC SILICON ETCH USING ANISOTROPIC ETCHANTS
- Publication number 20090111271
- Publication date Apr 30, 2009
- Honeywell International Inc.
- John S. Starzynski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Selective High Dielectric Constant Material Etchant
- Publication number 20080110748
- Publication date May 15, 2008
- John Starzynski
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
Selective removal chemistries for semiconductor applications, metho...
- Publication number 20060255315
- Publication date Nov 16, 2006
- Deborah L. Yellowaga
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Selective hafnium oxide etchant
- Publication number 20060054595
- Publication date Mar 16, 2006
- Honeywell International Inc.
- John Starzynski
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
Equipment and process for creating a custom sloped etch in a substrate
- Publication number 20050133479
- Publication date Jun 23, 2005
- Dan W. Youngner
- B81 - MICRO-STRUCTURAL TECHNOLOGY

John S. Starzynski

Person

Patents Grantslast 30 patents

Resonating beam accelerometer

Methods for making a sensitive resonating beam accelerometer

Methods and apparatus for improving performance of an accelerometer

Methods for making a sensitive resonating beam accelerometer

Patents Applicationslast 30 patents

REDUCING HYSTERESIS EFFECTS IN AN ACCELEROMETER

RESONATING BEAM ACCELEROMETER

METHODS AND APPARATUS FOR IMPROVING PERFORMANCE OF AN ACCELEROMETER

METHODS FOR MAKING A SENSITIVE RESONATING BEAM ACCELEROMETER

METHODS FOR MAKING A SENSITIVE RESONATING BEAM ACCELEROMETER

METHODS FOR ACCURATELY MEASURING THE THICKNESS OF AN EPITAXIAL LAYE...

ISOTROPIC SILICON ETCH USING ANISOTROPIC ETCHANTS

Selective High Dielectric Constant Material Etchant

Selective removal chemistries for semiconductor applications, metho...

Selective hafnium oxide etchant

Equipment and process for creating a custom sloped etch in a substrate