John Schaefer

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Miller Place, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer inspection system including a laser triangulation sensor
- Patent number 11,578,967
- Issue date Feb 14, 2023
- Onto Innovation Inc.
- John Schaefer
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER INSPECTION SYSTEM INCLUDING A LASER TRIANGULATION SENSOR
- Publication number 20230266117
- Publication date Aug 24, 2023
- ONTO INNOVATION INC.
- John Schaefer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LASER TRIANGULATION SENSOR SYSTEM AND METHOD FOR WAFER INSPECTION
- Publication number 20200357704
- Publication date Nov 12, 2020
- ONTO INNOVATION INC.
- John Schaefer
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION SYSTEM INCLUDING A LASER TRIANGULATION SENSOR
- Publication number 20200191557
- Publication date Jun 18, 2020
- Rudolph Technologies, Inc.
- John Schaefer
- G06 - COMPUTING CALCULATING COUNTING