John Scott

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Edfecliff, AU

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Patents Grantslast 30 patents

Information Patent Grant
Electron beam microscope with improved imaging gas and method of use
- Patent number 9,633,816
- Issue date Apr 25, 2017
- FEI Company
- Toby Shanley
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON BEAM MICROSCOPE WITH IMPROVED IMAGING GAS AND METHOD OF USE
- Publication number 20160343537
- Publication date Nov 24, 2016
- FEI Company
- Toby Shanley
- H01 - BASIC ELECTRIC ELEMENTS