John Sebastian Donnal

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Cambridge, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Non-intrusive monitoring
- Patent number 11,262,386
- Issue date Mar 1, 2022
- Massachusetts Institute of Technology
- John Sebastian Donnal
- G01 - MEASURING TESTING
Information Patent Grant
Non-intrusive monitoring
- Patent number 9,945,692
- Issue date Apr 17, 2018
- Massachusetts Institute of Technology
- Steven B. Leeb
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NON-INTRUSIVE MONITORING
- Publication number 20180306839
- Publication date Oct 25, 2018
- MASSACHUSETTS INTITUTE OF TECHNOLOGY
- John Sebastian Donnal
- G01 - MEASURING TESTING
Information Patent Application
NON-INTRUSIVE MONITORING
- Publication number 20140320125
- Publication date Oct 30, 2014
- Steven B. Leeb
- G01 - MEASURING TESTING