John Shing-Chun Tsang

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Lachine, CA

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Patents Applicationslast 30 patents

Information Patent Application
Mass Intensity profiling system and uses thereof
- Publication number 20060269944
- Publication date Nov 30, 2006
- Frank Reinaldo Morales Aguilera
- G01 - MEASURING TESTING
Information Patent Application
Mass intensity profiling system and uses thereof
- Publication number 20030129760
- Publication date Jul 10, 2003
- Frank Reinaldo Morales Aguilera
- G01 - MEASURING TESTING