John Spencer Baskin

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Pasadena, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for electron microscope with multiple cathodes
- Patent number 9,464,998
- Issue date Oct 11, 2016
- California Institute of Technology
- Ahmed H. Zewail
- G01 - MEASURING TESTING
Information Patent Grant
Control imaging methods in advanced ultrafast electron microscopy
- Patent number 8,766,181
- Issue date Jul 1, 2014
- California Institute of Technology
- Ahmed H. Zewail
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR ELECTRON MICROSCOPE WITH MULTIPLE CATHODES
- Publication number 20160005566
- Publication date Jan 7, 2016
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROL IMAGING METHODS IN ADVANCED ULTRAFAST ELECTRON MICROSCOPY
- Publication number 20140131574
- Publication date May 15, 2014
- California Institute of Technology
- Ahmed H. Zewail
- G01 - MEASURING TESTING