John Stephen Walther

Follow

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Batch editor for netlists described in a hardware description language
- Patent number 7,062,427
- Issue date Jun 13, 2006
- John Stephen Walther
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Technique for debugging an integrated circuit having a parallel sca...
- Patent number 6,941,498
- Issue date Sep 6, 2005
- Agilent Technologies, Inc.
- Ismed D. S. Hartano
- G01 - MEASURING TESTING
Information Patent Grant
Scan multiplexing for increasing the effective scan data exchange rate
- Patent number 6,865,704
- Issue date Mar 8, 2005
- Agilent Technologies, Inc.
- Stuart L. Whannel
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with scan flip-flop
- Patent number 6,380,780
- Issue date Apr 30, 2002
- Agilent Technologies, Inc.
- Robert C. Aitken
- G01 - MEASURING TESTING
Information Patent Grant
Local tristate control circuit
- Patent number 5,136,185
- Issue date Aug 4, 1992
- Hewlett-Packard Company
- Lee O. Fleming
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Technique for debugging an integrated circuit having a parallel sca...
- Publication number 20030172334
- Publication date Sep 11, 2003
- Ismed D.S. Hartano
- G01 - MEASURING TESTING
Information Patent Application
Batch editor for netlists described in a hardware description language
- Publication number 20030125925
- Publication date Jul 3, 2003
- John Stephen Walther
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scan multiplication
- Publication number 20030093731
- Publication date May 15, 2003
- Stuart L. Whannel
- G01 - MEASURING TESTING