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John Swindernan
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Knoxville, TN, US
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last 30 patents
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Patent Grant
Scanning probe microscope with independent force control and displa...
Patent number
8,028,343
Issue date
Sep 27, 2011
Nanonmechanics, Inc.
Warren C. Oliver
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Scanning Probe Microscope with Independent Force Control and Displa...
Publication number
20100192267
Publication date
Jul 29, 2010
Warren C. Oliver
G01 - MEASURING TESTING